JPS5190572A - - Google Patents
Info
- Publication number
- JPS5190572A JPS5190572A JP50015363A JP1536375A JPS5190572A JP S5190572 A JPS5190572 A JP S5190572A JP 50015363 A JP50015363 A JP 50015363A JP 1536375 A JP1536375 A JP 1536375A JP S5190572 A JPS5190572 A JP S5190572A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1536375A JPS544830B2 (enrdf_load_html_response) | 1975-02-07 | 1975-02-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1536375A JPS544830B2 (enrdf_load_html_response) | 1975-02-07 | 1975-02-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5190572A true JPS5190572A (enrdf_load_html_response) | 1976-08-09 |
| JPS544830B2 JPS544830B2 (enrdf_load_html_response) | 1979-03-10 |
Family
ID=11886703
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1536375A Expired JPS544830B2 (enrdf_load_html_response) | 1975-02-07 | 1975-02-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS544830B2 (enrdf_load_html_response) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5254381A (en) * | 1975-10-29 | 1977-05-02 | Mitsubishi Electric Corp | Method of testing moisture resistance of semiconductor device |
| JPS5390767A (en) * | 1977-01-20 | 1978-08-09 | Matsushita Electric Ind Co Ltd | Hermetic sealing testing method of semiconductor parts |
| JPS6039981U (ja) * | 1983-08-27 | 1985-03-20 | 楠本化成株式会社 | 環境試験器 |
| WO2009157037A1 (ja) * | 2008-06-24 | 2009-12-30 | アキム株式会社 | 電子部品検査装置、電子部品検査システム |
-
1975
- 1975-02-07 JP JP1536375A patent/JPS544830B2/ja not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5254381A (en) * | 1975-10-29 | 1977-05-02 | Mitsubishi Electric Corp | Method of testing moisture resistance of semiconductor device |
| JPS5390767A (en) * | 1977-01-20 | 1978-08-09 | Matsushita Electric Ind Co Ltd | Hermetic sealing testing method of semiconductor parts |
| JPS6039981U (ja) * | 1983-08-27 | 1985-03-20 | 楠本化成株式会社 | 環境試験器 |
| WO2009157037A1 (ja) * | 2008-06-24 | 2009-12-30 | アキム株式会社 | 電子部品検査装置、電子部品検査システム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS544830B2 (enrdf_load_html_response) | 1979-03-10 |