JPS5187972A - - Google Patents

Info

Publication number
JPS5187972A
JPS5187972A JP50012575A JP1257575A JPS5187972A JP S5187972 A JPS5187972 A JP S5187972A JP 50012575 A JP50012575 A JP 50012575A JP 1257575 A JP1257575 A JP 1257575A JP S5187972 A JPS5187972 A JP S5187972A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50012575A
Other languages
Japanese (ja)
Inventor
Yoichi Asano
Eiji Wada
Yoshikazu Suzumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50012575A priority Critical patent/JPS5187972A/ja
Publication of JPS5187972A publication Critical patent/JPS5187972A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
JP50012575A 1975-01-31 1975-01-31 Pending JPS5187972A (no)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50012575A JPS5187972A (no) 1975-01-31 1975-01-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50012575A JPS5187972A (no) 1975-01-31 1975-01-31

Publications (1)

Publication Number Publication Date
JPS5187972A true JPS5187972A (no) 1976-07-31

Family

ID=11809149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50012575A Pending JPS5187972A (no) 1975-01-31 1975-01-31

Country Status (1)

Country Link
JP (1) JPS5187972A (no)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105480U (ja) * 1991-02-22 1992-09-10 株式会社ヨコオ Ic用ソケツト
WO2019229798A1 (ja) * 2018-05-28 2019-12-05 三菱電機株式会社 半導体デバイスの電気特性測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS441666Y1 (no) * 1966-06-04 1969-01-22

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS441666Y1 (no) * 1966-06-04 1969-01-22

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105480U (ja) * 1991-02-22 1992-09-10 株式会社ヨコオ Ic用ソケツト
WO2019229798A1 (ja) * 2018-05-28 2019-12-05 三菱電機株式会社 半導体デバイスの電気特性測定装置
JPWO2019229798A1 (ja) * 2018-05-28 2021-02-12 三菱電機株式会社 半導体デバイスの電気特性測定装置

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