JPS5180173A - - Google Patents

Info

Publication number
JPS5180173A
JPS5180173A JP50004394A JP439475A JPS5180173A JP S5180173 A JPS5180173 A JP S5180173A JP 50004394 A JP50004394 A JP 50004394A JP 439475 A JP439475 A JP 439475A JP S5180173 A JPS5180173 A JP S5180173A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50004394A
Other languages
Japanese (ja)
Other versions
JPS5346671B2 (de
Inventor
Naotake Motoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP439475A priority Critical patent/JPS5346671B2/ja
Publication of JPS5180173A publication Critical patent/JPS5180173A/ja
Publication of JPS5346671B2 publication Critical patent/JPS5346671B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP439475A 1975-01-08 1975-01-08 Expired JPS5346671B2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP439475A JPS5346671B2 (de) 1975-01-08 1975-01-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP439475A JPS5346671B2 (de) 1975-01-08 1975-01-08

Publications (2)

Publication Number Publication Date
JPS5180173A true JPS5180173A (de) 1976-07-13
JPS5346671B2 JPS5346671B2 (de) 1978-12-15

Family

ID=11583121

Family Applications (1)

Application Number Title Priority Date Filing Date
JP439475A Expired JPS5346671B2 (de) 1975-01-08 1975-01-08

Country Status (1)

Country Link
JP (1) JPS5346671B2 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012168153A (ja) * 2011-01-25 2012-09-06 Institute Of National Colleges Of Technology Japan Cmos論理icパッケージおよび検査方法
JP2016109577A (ja) * 2014-12-08 2016-06-20 エスペック株式会社 パワーサイクル試験装置およびパワーサイクル試験方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012168153A (ja) * 2011-01-25 2012-09-06 Institute Of National Colleges Of Technology Japan Cmos論理icパッケージおよび検査方法
JP2016109577A (ja) * 2014-12-08 2016-06-20 エスペック株式会社 パワーサイクル試験装置およびパワーサイクル試験方法

Also Published As

Publication number Publication date
JPS5346671B2 (de) 1978-12-15

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