JPS515798B1 - - Google Patents
Info
- Publication number
- JPS515798B1 JPS515798B1 JP46011491A JP1149171A JPS515798B1 JP S515798 B1 JPS515798 B1 JP S515798B1 JP 46011491 A JP46011491 A JP 46011491A JP 1149171 A JP1149171 A JP 1149171A JP S515798 B1 JPS515798 B1 JP S515798B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
- G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US1631570A | 1970-03-04 | 1970-03-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS462392A JPS462392A (enExample) | 1971-10-14 |
| JPS515798B1 true JPS515798B1 (enExample) | 1976-02-23 |
Family
ID=21776512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP46011491A Pending JPS515798B1 (enExample) | 1970-03-04 | 1971-03-04 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3643126A (enExample) |
| JP (1) | JPS515798B1 (enExample) |
| DE (1) | DE2108993C3 (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5223591B2 (enExample) * | 1972-06-20 | 1977-06-25 | ||
| JPS5062475A (enExample) * | 1973-10-04 | 1975-05-28 | ||
| JPS567171Y2 (enExample) * | 1975-07-29 | 1981-02-17 | ||
| US4041387A (en) * | 1975-09-18 | 1977-08-09 | Hewlett-Packard Company | Apparatus and method for measuring the frequency of a sweeping signal |
| JPS5254072A (en) * | 1975-10-29 | 1977-05-02 | Nozawa Seisakusho Kk | High speed core wpapping and spherically shaping machine |
| JPS538178A (en) * | 1976-07-12 | 1978-01-25 | Takeda Riken Ind Co Ltd | Digital type field strength measuring device |
| JPS544177A (en) * | 1977-06-11 | 1979-01-12 | Anritsu Electric Co Ltd | Frequency measuring device |
| JPS5436981A (en) * | 1977-08-29 | 1979-03-19 | Takeda Riken Ind Co Ltd | Spectrum analyzer |
| DE2914143C2 (de) * | 1979-04-07 | 1981-10-01 | Rohde & Schwarz GmbH & Co KG, 8000 München | Gerät zum Untersuchen eines nach der Frequenz ausgewählten einzelnen Hochfrequenzsignales eines breiten Frequenzbandes |
| US4430611A (en) | 1981-07-29 | 1984-02-07 | The United States Of America As Represented By The United States Department Of Energy | Frequency spectrum analyzer with phase-lock |
| JPS57177171U (enExample) * | 1982-03-11 | 1982-11-09 | ||
| US4590477A (en) * | 1983-03-07 | 1986-05-20 | Eaton Corporation | Automatic calibration system for distance measurement receivers |
| JPS6058032A (ja) * | 1983-06-24 | 1985-04-04 | ナビスコ ブランズ インコ−ポレ−テツド | 可食製品を形成する方法及び装置 |
| US4647845A (en) * | 1984-09-20 | 1987-03-03 | Hewlett-Packard Company | Apparatus and method for utilizing an AC detection scalar network analyzer with a CW signal source |
| JPS61174674U (enExample) * | 1985-04-22 | 1986-10-30 | ||
| US4800378A (en) * | 1985-08-23 | 1989-01-24 | Snap-On Tools Corporation | Digital engine analyzer |
| JPS62103578A (ja) * | 1986-07-08 | 1987-05-14 | テクトロニツクス・インコ−ポレイテツド | デジタル波形表示装置 |
| DE3917411A1 (de) * | 1989-05-29 | 1990-12-06 | Brust Hans Detlef | Verfahren und anordnung zur schnellen spektralanalyse eines signals an einem oder mehreren messpunkten |
| US5099200A (en) * | 1990-01-12 | 1992-03-24 | Hewlett-Packard Company | I.f. calibration system |
| DE4009750C2 (de) * | 1990-03-27 | 1993-10-28 | Rohde & Schwarz | Heterodyner Analysator zum Messen von Pegel- und Phasen-Frequenzcharakteristiken von Vierpolen |
| US20080228293A1 (en) * | 2007-03-15 | 2008-09-18 | Tanaka Rick M | System and method for tuning positioning mechanisms for printing apparatus |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3441850A (en) * | 1966-02-18 | 1969-04-29 | Signatection Inc | Spectrum analysis apparatus |
-
1970
- 1970-03-04 US US16315A patent/US3643126A/en not_active Expired - Lifetime
-
1971
- 1971-02-25 DE DE2108993A patent/DE2108993C3/de not_active Expired
- 1971-03-04 JP JP46011491A patent/JPS515798B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE2108993C3 (de) | 1974-05-16 |
| DE2108993A1 (de) | 1971-09-16 |
| US3643126A (en) | 1972-02-15 |
| JPS462392A (enExample) | 1971-10-14 |
| DE2108993B2 (de) | 1973-10-18 |