JPS5132181A - Handotaisoshisokuteiyopuroobubarinoseizohoho - Google Patents
HandotaisoshisokuteiyopuroobubarinoseizohohoInfo
- Publication number
- JPS5132181A JPS5132181A JP49105407A JP10540774A JPS5132181A JP S5132181 A JPS5132181 A JP S5132181A JP 49105407 A JP49105407 A JP 49105407A JP 10540774 A JP10540774 A JP 10540774A JP S5132181 A JPS5132181 A JP S5132181A
- Authority
- JP
- Japan
- Prior art keywords
- handotaisoshisokuteiyopuroobubarinoseizohoho
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49105407A JPS5811739B2 (en) | 1974-09-11 | 1974-09-11 | Hand-made Thai Soshisoku Teiyo Pro - Bubarino Seizouhou |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP49105407A JPS5811739B2 (en) | 1974-09-11 | 1974-09-11 | Hand-made Thai Soshisoku Teiyo Pro - Bubarino Seizouhou |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5132181A true JPS5132181A (en) | 1976-03-18 |
JPS5811739B2 JPS5811739B2 (en) | 1983-03-04 |
Family
ID=14406749
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP49105407A Expired JPS5811739B2 (en) | 1974-09-11 | 1974-09-11 | Hand-made Thai Soshisoku Teiyo Pro - Bubarino Seizouhou |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5811739B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52139270U (en) * | 1976-04-16 | 1977-10-22 | ||
JPS57198077U (en) * | 1981-06-12 | 1982-12-16 | ||
JPS599934A (en) * | 1982-07-07 | 1984-01-19 | Nippon Denshi Zairyo Kk | Manufacture of probe card |
JPS5911640A (en) * | 1982-07-12 | 1984-01-21 | Mitsubishi Electric Corp | Probe card for test of wafer |
JPH04332872A (en) * | 1991-05-09 | 1992-11-19 | Rohm Co Ltd | Measurement terminal unit |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS487644U (en) * | 1971-06-09 | 1973-01-27 |
-
1974
- 1974-09-11 JP JP49105407A patent/JPS5811739B2/en not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS487644U (en) * | 1971-06-09 | 1973-01-27 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52139270U (en) * | 1976-04-16 | 1977-10-22 | ||
JPS5641768Y2 (en) * | 1976-04-16 | 1981-09-30 | ||
JPS57198077U (en) * | 1981-06-12 | 1982-12-16 | ||
JPS599934A (en) * | 1982-07-07 | 1984-01-19 | Nippon Denshi Zairyo Kk | Manufacture of probe card |
JPS6222529B2 (en) * | 1982-07-07 | 1987-05-19 | Nippon Denshi Zairyo Kk | |
JPS5911640A (en) * | 1982-07-12 | 1984-01-21 | Mitsubishi Electric Corp | Probe card for test of wafer |
JPH04332872A (en) * | 1991-05-09 | 1992-11-19 | Rohm Co Ltd | Measurement terminal unit |
Also Published As
Publication number | Publication date |
---|---|
JPS5811739B2 (en) | 1983-03-04 |