JPS51134172A - Multi-wavelength filter photometer - Google Patents

Multi-wavelength filter photometer

Info

Publication number
JPS51134172A
JPS51134172A JP5729375A JP5729375A JPS51134172A JP S51134172 A JPS51134172 A JP S51134172A JP 5729375 A JP5729375 A JP 5729375A JP 5729375 A JP5729375 A JP 5729375A JP S51134172 A JPS51134172 A JP S51134172A
Authority
JP
Japan
Prior art keywords
wavelength filter
filter photometer
photometer
assorting
band
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5729375A
Other languages
Japanese (ja)
Inventor
Tadashi Motokawa
Seiji Tsukada
Yasuhisa Suzuki
Tadafumi Kuroishi
Mikio Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5729375A priority Critical patent/JPS51134172A/en
Publication of JPS51134172A publication Critical patent/JPS51134172A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Abstract

PURPOSE:A multi-wavelength filter photometer of simple structure and with less energy loss is made by assorting a band-pass filter and a beam splitter together.
JP5729375A 1975-05-16 1975-05-16 Multi-wavelength filter photometer Pending JPS51134172A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5729375A JPS51134172A (en) 1975-05-16 1975-05-16 Multi-wavelength filter photometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5729375A JPS51134172A (en) 1975-05-16 1975-05-16 Multi-wavelength filter photometer

Publications (1)

Publication Number Publication Date
JPS51134172A true JPS51134172A (en) 1976-11-20

Family

ID=13051494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5729375A Pending JPS51134172A (en) 1975-05-16 1975-05-16 Multi-wavelength filter photometer

Country Status (1)

Country Link
JP (1) JPS51134172A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2571491A1 (en) * 1984-08-07 1986-04-11 Sclavo Spa PHOTOMETER WITH PULSED LIGHT AND MULTIPLE WAVELENGTHS FOR NON-AGGRESSIVE CONTROL

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2571491A1 (en) * 1984-08-07 1986-04-11 Sclavo Spa PHOTOMETER WITH PULSED LIGHT AND MULTIPLE WAVELENGTHS FOR NON-AGGRESSIVE CONTROL

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