JPS51104755U - - Google Patents
Info
- Publication number
- JPS51104755U JPS51104755U JP2195075U JP2195075U JPS51104755U JP S51104755 U JPS51104755 U JP S51104755U JP 2195075 U JP2195075 U JP 2195075U JP 2195075 U JP2195075 U JP 2195075U JP S51104755 U JPS51104755 U JP S51104755U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2195075U JPS51104755U (en) | 1975-02-19 | 1975-02-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2195075U JPS51104755U (en) | 1975-02-19 | 1975-02-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51104755U true JPS51104755U (en) | 1976-08-21 |
Family
ID=28114265
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2195075U Pending JPS51104755U (en) | 1975-02-19 | 1975-02-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51104755U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09281184A (en) * | 1996-04-17 | 1997-10-31 | Matsushita Electron Corp | Apparatus for inspecting semiconductor device |
WO2022191236A1 (en) * | 2021-03-12 | 2022-09-15 | 三菱電機株式会社 | Electrical current testing device and electrical current testing method |
-
1975
- 1975-02-19 JP JP2195075U patent/JPS51104755U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09281184A (en) * | 1996-04-17 | 1997-10-31 | Matsushita Electron Corp | Apparatus for inspecting semiconductor device |
WO2022191236A1 (en) * | 2021-03-12 | 2022-09-15 | 三菱電機株式会社 | Electrical current testing device and electrical current testing method |