JPS51104755U - - Google Patents

Info

Publication number
JPS51104755U
JPS51104755U JP2195075U JP2195075U JPS51104755U JP S51104755 U JPS51104755 U JP S51104755U JP 2195075 U JP2195075 U JP 2195075U JP 2195075 U JP2195075 U JP 2195075U JP S51104755 U JPS51104755 U JP S51104755U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2195075U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2195075U priority Critical patent/JPS51104755U/ja
Publication of JPS51104755U publication Critical patent/JPS51104755U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Relating To Insulation (AREA)
JP2195075U 1975-02-19 1975-02-19 Pending JPS51104755U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2195075U JPS51104755U (en) 1975-02-19 1975-02-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2195075U JPS51104755U (en) 1975-02-19 1975-02-19

Publications (1)

Publication Number Publication Date
JPS51104755U true JPS51104755U (en) 1976-08-21

Family

ID=28114265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2195075U Pending JPS51104755U (en) 1975-02-19 1975-02-19

Country Status (1)

Country Link
JP (1) JPS51104755U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09281184A (en) * 1996-04-17 1997-10-31 Matsushita Electron Corp Apparatus for inspecting semiconductor device
WO2022191236A1 (en) * 2021-03-12 2022-09-15 三菱電機株式会社 Electrical current testing device and electrical current testing method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09281184A (en) * 1996-04-17 1997-10-31 Matsushita Electron Corp Apparatus for inspecting semiconductor device
WO2022191236A1 (en) * 2021-03-12 2022-09-15 三菱電機株式会社 Electrical current testing device and electrical current testing method

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