JPS5098769A - - Google Patents
Info
- Publication number
- JPS5098769A JPS5098769A JP373774A JP373774A JPS5098769A JP S5098769 A JPS5098769 A JP S5098769A JP 373774 A JP373774 A JP 373774A JP 373774 A JP373774 A JP 373774A JP S5098769 A JPS5098769 A JP S5098769A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP373774A JPS5098769A (en) | 1973-12-26 | 1973-12-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP373774A JPS5098769A (en) | 1973-12-26 | 1973-12-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5098769A true JPS5098769A (en) | 1975-08-06 |
Family
ID=11565533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP373774A Pending JPS5098769A (en) | 1973-12-26 | 1973-12-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5098769A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1207545A2 (en) * | 2000-11-17 | 2002-05-22 | Denki Kagaku Kogyo Kabushiki Kaisha | Method for determining and setting an operational condition of a thermal field electron emitter |
-
1973
- 1973-12-26 JP JP373774A patent/JPS5098769A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1207545A2 (en) * | 2000-11-17 | 2002-05-22 | Denki Kagaku Kogyo Kabushiki Kaisha | Method for determining and setting an operational condition of a thermal field electron emitter |
| EP1207545A3 (en) * | 2000-11-17 | 2007-05-23 | Denki Kagaku Kogyo Kabushiki Kaisha | Method for determining and setting an operational condition of a thermal field electron emitter |