JPS5067070A - - Google Patents
Info
- Publication number
- JPS5067070A JPS5067070A JP48113971A JP11397173A JPS5067070A JP S5067070 A JPS5067070 A JP S5067070A JP 48113971 A JP48113971 A JP 48113971A JP 11397173 A JP11397173 A JP 11397173A JP S5067070 A JPS5067070 A JP S5067070A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48113971A JPS5067070A (en) | 1973-10-12 | 1973-10-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48113971A JPS5067070A (en) | 1973-10-12 | 1973-10-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5067070A true JPS5067070A (en) | 1975-06-05 |
Family
ID=14625788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48113971A Pending JPS5067070A (en) | 1973-10-12 | 1973-10-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5067070A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5780065U (en) * | 1980-11-04 | 1982-05-18 | ||
| JP2007200573A (en) * | 2006-01-23 | 2007-08-09 | Hitachi High-Technologies Corp | Electron microscope and controlling method of the same |
-
1973
- 1973-10-12 JP JP48113971A patent/JPS5067070A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5780065U (en) * | 1980-11-04 | 1982-05-18 | ||
| JP2007200573A (en) * | 2006-01-23 | 2007-08-09 | Hitachi High-Technologies Corp | Electron microscope and controlling method of the same |
| JP4653666B2 (en) * | 2006-01-23 | 2011-03-16 | 株式会社日立ハイテクノロジーズ | Electron microscope and control method thereof |