JPS5047585A - - Google Patents
Info
- Publication number
- JPS5047585A JPS5047585A JP48097909A JP9790973A JPS5047585A JP S5047585 A JPS5047585 A JP S5047585A JP 48097909 A JP48097909 A JP 48097909A JP 9790973 A JP9790973 A JP 9790973A JP S5047585 A JPS5047585 A JP S5047585A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48097909A JPS5758625B2 (ja) | 1973-08-31 | 1973-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48097909A JPS5758625B2 (ja) | 1973-08-31 | 1973-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5047585A true JPS5047585A (ja) | 1975-04-28 |
| JPS5758625B2 JPS5758625B2 (ja) | 1982-12-10 |
Family
ID=14204830
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48097909A Expired JPS5758625B2 (ja) | 1973-08-31 | 1973-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5758625B2 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5595855A (en) * | 1978-11-27 | 1980-07-21 | Philips Corp | Line scanning and xxray map intensifier for data in scanntype electron microscope |
| JPS60216249A (ja) * | 1984-04-12 | 1985-10-29 | Nippon Atom Ind Group Co Ltd | 螢光ｘ線分析装置 |
| EP4491303A1 (en) * | 2023-07-12 | 2025-01-15 | General Electric Company | Apparatuses, systems, and methods for three-dimensional, in-situ inspection of an additively manufactured component |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60166722U (ja) * | 1984-04-16 | 1985-11-06 | 渡辺 郡治 | 可動吊子 |
| CN100422769C (zh) * | 2003-11-24 | 2008-10-01 | 护照系统公司 | 利用核共振荧光成像的自适应材料扫描 |
-
1973
- 1973-08-31 JP JP48097909A patent/JPS5758625B2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5595855A (en) * | 1978-11-27 | 1980-07-21 | Philips Corp | Line scanning and xxray map intensifier for data in scanntype electron microscope |
| JPS60216249A (ja) * | 1984-04-12 | 1985-10-29 | Nippon Atom Ind Group Co Ltd | 螢光ｘ線分析装置 |
| EP4491303A1 (en) * | 2023-07-12 | 2025-01-15 | General Electric Company | Apparatuses, systems, and methods for three-dimensional, in-situ inspection of an additively manufactured component |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5758625B2 (ja) | 1982-12-10 |