JPS5042652U - - Google Patents
Info
- Publication number
- JPS5042652U JPS5042652U JP9623673U JP9623673U JPS5042652U JP S5042652 U JPS5042652 U JP S5042652U JP 9623673 U JP9623673 U JP 9623673U JP 9623673 U JP9623673 U JP 9623673U JP S5042652 U JPS5042652 U JP S5042652U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9623673U JPS534768Y2 (en) | 1973-08-16 | 1973-08-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9623673U JPS534768Y2 (en) | 1973-08-16 | 1973-08-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5042652U true JPS5042652U (en) | 1975-04-30 |
JPS534768Y2 JPS534768Y2 (en) | 1978-02-06 |
Family
ID=28293718
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9623673U Expired JPS534768Y2 (en) | 1973-08-16 | 1973-08-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS534768Y2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6166353A (en) * | 1984-09-07 | 1986-04-05 | Jeol Ltd | Method for correcting scanning image |
JPH052876U (en) * | 1991-03-22 | 1993-01-19 | 三菱電機株式会社 | Module extraction tool for electronic devices |
JP2009122055A (en) * | 2007-11-19 | 2009-06-04 | Hitachi High-Technologies Corp | Semiconductor appearance inspection device and inspection method |
-
1973
- 1973-08-16 JP JP9623673U patent/JPS534768Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6166353A (en) * | 1984-09-07 | 1986-04-05 | Jeol Ltd | Method for correcting scanning image |
JPH052876U (en) * | 1991-03-22 | 1993-01-19 | 三菱電機株式会社 | Module extraction tool for electronic devices |
JP2009122055A (en) * | 2007-11-19 | 2009-06-04 | Hitachi High-Technologies Corp | Semiconductor appearance inspection device and inspection method |
Also Published As
Publication number | Publication date |
---|---|
JPS534768Y2 (en) | 1978-02-06 |