JPS5039995A - - Google Patents
Info
- Publication number
- JPS5039995A JPS5039995A JP48090838A JP9083873A JPS5039995A JP S5039995 A JPS5039995 A JP S5039995A JP 48090838 A JP48090838 A JP 48090838A JP 9083873 A JP9083873 A JP 9083873A JP S5039995 A JPS5039995 A JP S5039995A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Fluid Pressure (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9083873A JPS5410276B2 (ja) | 1973-08-15 | 1973-08-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9083873A JPS5410276B2 (ja) | 1973-08-15 | 1973-08-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5039995A true JPS5039995A (ja) | 1975-04-12 |
| JPS5410276B2 JPS5410276B2 (ja) | 1979-05-02 |
Family
ID=14009711
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9083873A Expired JPS5410276B2 (ja) | 1973-08-15 | 1973-08-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5410276B2 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5284982A (en) * | 1976-01-06 | 1977-07-14 | Sharp Corp | High dielectric strength field effect semiconductor device |
| US5874768A (en) * | 1994-06-15 | 1999-02-23 | Nippondenso Co., Ltd. | Semiconductor device having a high breakdown voltage |
| JP2021513730A (ja) * | 2018-02-13 | 2021-05-27 | ビオメリュー・インコーポレイテッド | 計器内の荷電粒子の生成を確認するための方法、および関連する計器 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5040359A (ja) * | 1973-08-27 | 1975-04-14 |
-
1973
- 1973-08-15 JP JP9083873A patent/JPS5410276B2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5040359A (ja) * | 1973-08-27 | 1975-04-14 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5284982A (en) * | 1976-01-06 | 1977-07-14 | Sharp Corp | High dielectric strength field effect semiconductor device |
| US5874768A (en) * | 1994-06-15 | 1999-02-23 | Nippondenso Co., Ltd. | Semiconductor device having a high breakdown voltage |
| JP2021513730A (ja) * | 2018-02-13 | 2021-05-27 | ビオメリュー・インコーポレイテッド | 計器内の荷電粒子の生成を確認するための方法、および関連する計器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5410276B2 (ja) | 1979-05-02 |