JPS5039071A - - Google Patents
Info
- Publication number
- JPS5039071A JPS5039071A JP48088527A JP8852773A JPS5039071A JP S5039071 A JPS5039071 A JP S5039071A JP 48088527 A JP48088527 A JP 48088527A JP 8852773 A JP8852773 A JP 8852773A JP S5039071 A JPS5039071 A JP S5039071A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8852773A JPS5729671B2 (enExample) | 1973-08-08 | 1973-08-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8852773A JPS5729671B2 (enExample) | 1973-08-08 | 1973-08-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5039071A true JPS5039071A (enExample) | 1975-04-10 |
| JPS5729671B2 JPS5729671B2 (enExample) | 1982-06-24 |
Family
ID=13945299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8852773A Expired JPS5729671B2 (enExample) | 1973-08-08 | 1973-08-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5729671B2 (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5469077A (en) * | 1977-11-11 | 1979-06-02 | Mitsubishi Electric Corp | Automatic selection method for semiconductor element and its apparatus |
| JPS5614912A (en) * | 1979-07-18 | 1981-02-13 | Nec Corp | Test device |
| JPS5982880U (ja) * | 1982-11-27 | 1984-06-04 | ロ−ム株式会社 | 半導体テスタ−用自己診断装置 |
| JPS61181379U (enExample) * | 1984-12-11 | 1986-11-12 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS448548Y1 (enExample) * | 1966-09-28 | 1969-04-04 |
-
1973
- 1973-08-08 JP JP8852773A patent/JPS5729671B2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS448548Y1 (enExample) * | 1966-09-28 | 1969-04-04 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5469077A (en) * | 1977-11-11 | 1979-06-02 | Mitsubishi Electric Corp | Automatic selection method for semiconductor element and its apparatus |
| JPS5614912A (en) * | 1979-07-18 | 1981-02-13 | Nec Corp | Test device |
| JPS5982880U (ja) * | 1982-11-27 | 1984-06-04 | ロ−ム株式会社 | 半導体テスタ−用自己診断装置 |
| JPS61181379U (enExample) * | 1984-12-11 | 1986-11-12 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5729671B2 (enExample) | 1982-06-24 |