JPS5030469A - - Google Patents
Info
- Publication number
- JPS5030469A JPS5030469A JP48081669A JP8166973A JPS5030469A JP S5030469 A JPS5030469 A JP S5030469A JP 48081669 A JP48081669 A JP 48081669A JP 8166973 A JP8166973 A JP 8166973A JP S5030469 A JPS5030469 A JP S5030469A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Bipolar Transistors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8166973A JPS5317388B2 (enrdf_load_stackoverflow) | 1973-07-17 | 1973-07-17 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8166973A JPS5317388B2 (enrdf_load_stackoverflow) | 1973-07-17 | 1973-07-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5030469A true JPS5030469A (enrdf_load_stackoverflow) | 1975-03-26 |
JPS5317388B2 JPS5317388B2 (enrdf_load_stackoverflow) | 1978-06-08 |
Family
ID=13752734
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8166973A Expired JPS5317388B2 (enrdf_load_stackoverflow) | 1973-07-17 | 1973-07-17 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5317388B2 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58158508A (ja) * | 1982-03-16 | 1983-09-20 | Mitsubishi Heavy Ind Ltd | 高温ひずみ計測方法 |
JPS63148154A (ja) * | 1986-12-11 | 1988-06-21 | Shinagawa Refract Co Ltd | セラミツクス等の熱間における変位測定装置 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6199863U (enrdf_load_stackoverflow) * | 1984-12-06 | 1986-06-26 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3372067A (en) * | 1963-02-25 | 1968-03-05 | Telefunken Patent | Method of forming a semiconductor by masking and diffusion |
US3575745A (en) * | 1969-04-02 | 1971-04-20 | Bryan H Hill | Integrated circuit fabrication |
-
1973
- 1973-07-17 JP JP8166973A patent/JPS5317388B2/ja not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3372067A (en) * | 1963-02-25 | 1968-03-05 | Telefunken Patent | Method of forming a semiconductor by masking and diffusion |
US3575745A (en) * | 1969-04-02 | 1971-04-20 | Bryan H Hill | Integrated circuit fabrication |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58158508A (ja) * | 1982-03-16 | 1983-09-20 | Mitsubishi Heavy Ind Ltd | 高温ひずみ計測方法 |
JPS63148154A (ja) * | 1986-12-11 | 1988-06-21 | Shinagawa Refract Co Ltd | セラミツクス等の熱間における変位測定装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS5317388B2 (enrdf_load_stackoverflow) | 1978-06-08 |