JPS5029675B1 - - Google Patents

Info

Publication number
JPS5029675B1
JPS5029675B1 JP45059006A JP5900670A JPS5029675B1 JP S5029675 B1 JPS5029675 B1 JP S5029675B1 JP 45059006 A JP45059006 A JP 45059006A JP 5900670 A JP5900670 A JP 5900670A JP S5029675 B1 JPS5029675 B1 JP S5029675B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45059006A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5029675B1 publication Critical patent/JPS5029675B1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/24—Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B5/25—Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP45059006A 1969-07-07 1970-07-07 Pending JPS5029675B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU5756969 1969-07-07

Publications (1)

Publication Number Publication Date
JPS5029675B1 true JPS5029675B1 (ja) 1975-09-25

Family

ID=3742923

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45059006A Pending JPS5029675B1 (ja) 1969-07-07 1970-07-07

Country Status (5)

Country Link
US (1) US3614229A (ja)
JP (1) JPS5029675B1 (ja)
DE (1) DE2033425C3 (ja)
GB (1) GB1292394A (ja)
NL (1) NL7009963A (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3723006A (en) * 1971-05-07 1973-03-27 Supper C Co Method and apparatus for selecting and handling particulate specimens using a vaccum probe
US3794769A (en) * 1972-01-19 1974-02-26 Bell & Howell Co Azimuth adjustment particularly for magnetic heads
JPS61282624A (ja) * 1985-06-07 1986-12-12 Dainippon Screen Mfg Co Ltd エンコ−ダの取付け調整装置
US4723075A (en) * 1985-06-12 1988-02-02 The United States Of America As Represented By The Secretary Of The Air Force Translational mount for large optical elements
US5422718A (en) * 1993-05-10 1995-06-06 The Center For Innovative Technology Elastic-part immersion cell for analyzing microstructures in materials
DE19604001C2 (de) * 1996-02-05 1998-07-16 Leica Instr Gmbh Einrichtung zur Orientierung eines gekühlten Objektkopfes in einem Kryostat-Mikrotom
US7660389B1 (en) * 2007-08-17 2010-02-09 Bruker Axs, Inc. Sample alignment mechanism for X-ray diffraction instrumentation
EP3933390A1 (en) * 2020-07-02 2022-01-05 Merck Patent GmbH Tool holder for manipulating small objects

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3504178A (en) * 1968-05-28 1970-03-31 Kennecott Copper Corp Method for determining crystall-ographic orientation

Also Published As

Publication number Publication date
NL7009963A (ja) 1971-01-11
US3614229A (en) 1971-10-19
DE2033425B2 (de) 1978-03-02
DE2033425C3 (de) 1978-10-26
GB1292394A (en) 1972-10-11
DE2033425A1 (de) 1971-04-01

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