JPS5020867B1 - - Google Patents
Info
- Publication number
- JPS5020867B1 JPS5020867B1 JP2200570A JP2200570A JPS5020867B1 JP S5020867 B1 JPS5020867 B1 JP S5020867B1 JP 2200570 A JP2200570 A JP 2200570A JP 2200570 A JP2200570 A JP 2200570A JP S5020867 B1 JPS5020867 B1 JP S5020867B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Radiation (AREA)
- Nuclear Medicine (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2200570A JPS5020867B1 (ja) | 1970-03-17 | 1970-03-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2200570A JPS5020867B1 (ja) | 1970-03-17 | 1970-03-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5020867B1 true JPS5020867B1 (ja) | 1975-07-18 |
Family
ID=12070875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2200570A Pending JPS5020867B1 (ja) | 1970-03-17 | 1970-03-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5020867B1 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59148511U (ja) * | 1983-03-25 | 1984-10-04 | 中村 克孝 | 業務用かまど |
| WO2003010557A1 (en) * | 2001-07-26 | 2003-02-06 | Nihon Medi-Physics Co., Ltd. | Radiation detector |
| EP3803933A1 (en) * | 2018-06-08 | 2021-04-14 | ASML Netherlands B.V. | Semiconductor charged particle detector for microscopy |
-
1970
- 1970-03-17 JP JP2200570A patent/JPS5020867B1/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59148511U (ja) * | 1983-03-25 | 1984-10-04 | 中村 克孝 | 業務用かまど |
| WO2003010557A1 (en) * | 2001-07-26 | 2003-02-06 | Nihon Medi-Physics Co., Ltd. | Radiation detector |
| EP3803933A1 (en) * | 2018-06-08 | 2021-04-14 | ASML Netherlands B.V. | Semiconductor charged particle detector for microscopy |