JPS50153889A - - Google Patents

Info

Publication number
JPS50153889A
JPS50153889A JP49061173A JP6117374A JPS50153889A JP S50153889 A JPS50153889 A JP S50153889A JP 49061173 A JP49061173 A JP 49061173A JP 6117374 A JP6117374 A JP 6117374A JP S50153889 A JPS50153889 A JP S50153889A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP49061173A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP49061173A priority Critical patent/JPS50153889A/ja
Publication of JPS50153889A publication Critical patent/JPS50153889A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Apparatus For Radiation Diagnosis (AREA)
  • X-Ray Techniques (AREA)
JP49061173A 1974-05-30 1974-05-30 Pending JPS50153889A (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP49061173A JPS50153889A (de) 1974-05-30 1974-05-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49061173A JPS50153889A (de) 1974-05-30 1974-05-30

Publications (1)

Publication Number Publication Date
JPS50153889A true JPS50153889A (de) 1975-12-11

Family

ID=13163480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49061173A Pending JPS50153889A (de) 1974-05-30 1974-05-30

Country Status (1)

Country Link
JP (1) JPS50153889A (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5519132A (en) * 1978-07-27 1980-02-09 Nippon Electron Optics Lab Xxray section image obtaining method
JP2014133183A (ja) * 2006-04-14 2014-07-24 William Beaumont Hospital コーンビームコンピュータ断層撮影システム及び被検体の撮像方法
CN109791811A (zh) * 2016-09-30 2019-05-21 美国科学及工程股份有限公司 用于2d扫描光束成像的x射线源

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5519132A (en) * 1978-07-27 1980-02-09 Nippon Electron Optics Lab Xxray section image obtaining method
JP2014133183A (ja) * 2006-04-14 2014-07-24 William Beaumont Hospital コーンビームコンピュータ断層撮影システム及び被検体の撮像方法
CN109791811A (zh) * 2016-09-30 2019-05-21 美国科学及工程股份有限公司 用于2d扫描光束成像的x射线源
EP3520120A4 (de) * 2016-09-30 2020-07-08 American Science & Engineering, Inc. Röntgenstrahlenquelle zur zweidimensionalen abtaststrahlbildgebung

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