JPS50150375A - - Google Patents
Info
- Publication number
- JPS50150375A JPS50150375A JP5757874A JP5757874A JPS50150375A JP S50150375 A JPS50150375 A JP S50150375A JP 5757874 A JP5757874 A JP 5757874A JP 5757874 A JP5757874 A JP 5757874A JP S50150375 A JPS50150375 A JP S50150375A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5757874A JPS54153B2 (cg-RX-API-DMAC10.html) | 1974-05-21 | 1974-05-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5757874A JPS54153B2 (cg-RX-API-DMAC10.html) | 1974-05-21 | 1974-05-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50150375A true JPS50150375A (cg-RX-API-DMAC10.html) | 1975-12-02 |
| JPS54153B2 JPS54153B2 (cg-RX-API-DMAC10.html) | 1979-01-06 |
Family
ID=13059722
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5757874A Expired JPS54153B2 (cg-RX-API-DMAC10.html) | 1974-05-21 | 1974-05-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54153B2 (cg-RX-API-DMAC10.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59175742A (ja) * | 1983-03-26 | 1984-10-04 | Nec Home Electronics Ltd | 電子部品のストレス試験方法 |
| JPS61187244A (ja) * | 1985-02-14 | 1986-08-20 | Matsushita Electronics Corp | 半導体評価装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4828827A (cg-RX-API-DMAC10.html) * | 1971-08-16 | 1973-04-17 |
-
1974
- 1974-05-21 JP JP5757874A patent/JPS54153B2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4828827A (cg-RX-API-DMAC10.html) * | 1971-08-16 | 1973-04-17 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59175742A (ja) * | 1983-03-26 | 1984-10-04 | Nec Home Electronics Ltd | 電子部品のストレス試験方法 |
| JPS61187244A (ja) * | 1985-02-14 | 1986-08-20 | Matsushita Electronics Corp | 半導体評価装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS54153B2 (cg-RX-API-DMAC10.html) | 1979-01-06 |