JPS50143466U - - Google Patents
Info
- Publication number
- JPS50143466U JPS50143466U JP5350474U JP5350474U JPS50143466U JP S50143466 U JPS50143466 U JP S50143466U JP 5350474 U JP5350474 U JP 5350474U JP 5350474 U JP5350474 U JP 5350474U JP S50143466 U JPS50143466 U JP S50143466U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5350474U JPS5543663Y2 (en) | 1974-05-11 | 1974-05-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5350474U JPS5543663Y2 (en) | 1974-05-11 | 1974-05-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS50143466U true JPS50143466U (en) | 1975-11-27 |
JPS5543663Y2 JPS5543663Y2 (en) | 1980-10-14 |
Family
ID=28202363
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5350474U Expired JPS5543663Y2 (en) | 1974-05-11 | 1974-05-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5543663Y2 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01149354A (en) * | 1987-12-04 | 1989-06-12 | Hitachi Ltd | Electron microscope |
JP2012009247A (en) * | 2010-06-24 | 2012-01-12 | Topcon Corp | Electron microscope system |
JP2012138324A (en) * | 2010-12-28 | 2012-07-19 | Topcon Corp | Secondary electron detector and charge particle beam apparatus |
JP2013191576A (en) * | 2013-05-13 | 2013-09-26 | Horiba Ltd | Electron microscope device |
WO2013168488A1 (en) * | 2012-05-11 | 2013-11-14 | 株式会社 日立ハイテクノロジーズ | Charged particle beam microscope |
JP2019133787A (en) * | 2018-01-30 | 2019-08-08 | 日本電子株式会社 | Charged particle beam device |
-
1974
- 1974-05-11 JP JP5350474U patent/JPS5543663Y2/ja not_active Expired
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01149354A (en) * | 1987-12-04 | 1989-06-12 | Hitachi Ltd | Electron microscope |
JP2012009247A (en) * | 2010-06-24 | 2012-01-12 | Topcon Corp | Electron microscope system |
JP2012138324A (en) * | 2010-12-28 | 2012-07-19 | Topcon Corp | Secondary electron detector and charge particle beam apparatus |
WO2013168488A1 (en) * | 2012-05-11 | 2013-11-14 | 株式会社 日立ハイテクノロジーズ | Charged particle beam microscope |
JP2013191576A (en) * | 2013-05-13 | 2013-09-26 | Horiba Ltd | Electron microscope device |
JP2019133787A (en) * | 2018-01-30 | 2019-08-08 | 日本電子株式会社 | Charged particle beam device |
Also Published As
Publication number | Publication date |
---|---|
JPS5543663Y2 (en) | 1980-10-14 |