JPS5013851Y1 - - Google Patents

Info

Publication number
JPS5013851Y1
JPS5013851Y1 JP2566870U JP2566870U JPS5013851Y1 JP S5013851 Y1 JPS5013851 Y1 JP S5013851Y1 JP 2566870 U JP2566870 U JP 2566870U JP 2566870 U JP2566870 U JP 2566870U JP S5013851 Y1 JPS5013851 Y1 JP S5013851Y1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2566870U
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2566870U priority Critical patent/JPS5013851Y1/ja
Publication of JPS5013851Y1 publication Critical patent/JPS5013851Y1/ja
Expired legal-status Critical Current

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Landscapes

  • Welding Or Cutting Using Electron Beams (AREA)
JP2566870U 1970-03-17 1970-03-17 Expired JPS5013851Y1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2566870U JPS5013851Y1 (ja) 1970-03-17 1970-03-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2566870U JPS5013851Y1 (ja) 1970-03-17 1970-03-17

Publications (1)

Publication Number Publication Date
JPS5013851Y1 true JPS5013851Y1 (ja) 1975-04-28

Family

ID=33049614

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2566870U Expired JPS5013851Y1 (ja) 1970-03-17 1970-03-17

Country Status (1)

Country Link
JP (1) JPS5013851Y1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008511115A (ja) * 2004-08-24 2008-04-10 セラ セミコンダクター エンジニアリング ラボラトリーズ リミテッド 被加工物の有向多偏向イオンビームミリングならびにその程度の決定および制御

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008511115A (ja) * 2004-08-24 2008-04-10 セラ セミコンダクター エンジニアリング ラボラトリーズ リミテッド 被加工物の有向多偏向イオンビームミリングならびにその程度の決定および制御

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