JPS50120687A - - Google Patents

Info

Publication number
JPS50120687A
JPS50120687A JP2648374A JP2648374A JPS50120687A JP S50120687 A JPS50120687 A JP S50120687A JP 2648374 A JP2648374 A JP 2648374A JP 2648374 A JP2648374 A JP 2648374A JP S50120687 A JPS50120687 A JP S50120687A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2648374A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2648374A priority Critical patent/JPS50120687A/ja
Publication of JPS50120687A publication Critical patent/JPS50120687A/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP2648374A 1974-03-06 1974-03-06 Pending JPS50120687A (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2648374A JPS50120687A (fr) 1974-03-06 1974-03-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2648374A JPS50120687A (fr) 1974-03-06 1974-03-06

Publications (1)

Publication Number Publication Date
JPS50120687A true JPS50120687A (fr) 1975-09-22

Family

ID=12194730

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2648374A Pending JPS50120687A (fr) 1974-03-06 1974-03-06

Country Status (1)

Country Link
JP (1) JPS50120687A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62220845A (ja) * 1986-03-22 1987-09-29 Shimadzu Corp Ｘ線源及び分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62220845A (ja) * 1986-03-22 1987-09-29 Shimadzu Corp Ｘ線源及び分析装置

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