JPS50110576A - - Google Patents
Info
- Publication number
- JPS50110576A JPS50110576A JP1542274A JP1542274A JPS50110576A JP S50110576 A JPS50110576 A JP S50110576A JP 1542274 A JP1542274 A JP 1542274A JP 1542274 A JP1542274 A JP 1542274A JP S50110576 A JPS50110576 A JP S50110576A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1542274A JPS50110576A (el) | 1974-02-08 | 1974-02-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1542274A JPS50110576A (el) | 1974-02-08 | 1974-02-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS50110576A true JPS50110576A (el) | 1975-08-30 |
Family
ID=11888315
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1542274A Pending JPS50110576A (el) | 1974-02-08 | 1974-02-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS50110576A (el) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63190975U (el) * | 1987-05-29 | 1988-12-08 | ||
| JPH11271398A (ja) * | 1998-03-25 | 1999-10-08 | Sharp Corp | 半導体集積回路検査装置及びその故障検出方法 |
| JP2015090745A (ja) * | 2013-11-05 | 2015-05-11 | エスペック株式会社 | 外部短絡試験装置及び外部短絡試験方法 |
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1974
- 1974-02-08 JP JP1542274A patent/JPS50110576A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63190975U (el) * | 1987-05-29 | 1988-12-08 | ||
| JPH11271398A (ja) * | 1998-03-25 | 1999-10-08 | Sharp Corp | 半導体集積回路検査装置及びその故障検出方法 |
| JP2015090745A (ja) * | 2013-11-05 | 2015-05-11 | エスペック株式会社 | 外部短絡試験装置及び外部短絡試験方法 |