JPS50107987A - - Google Patents
Info
- Publication number
- JPS50107987A JPS50107987A JP1186974A JP1186974A JPS50107987A JP S50107987 A JPS50107987 A JP S50107987A JP 1186974 A JP1186974 A JP 1186974A JP 1186974 A JP1186974 A JP 1186974A JP S50107987 A JPS50107987 A JP S50107987A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Image Input (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49011869A JPS6122254B2 (es) | 1974-01-30 | 1974-01-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP49011869A JPS6122254B2 (es) | 1974-01-30 | 1974-01-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50107987A true JPS50107987A (es) | 1975-08-25 |
| JPS6122254B2 JPS6122254B2 (es) | 1986-05-30 |
Family
ID=11789717
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP49011869A Expired JPS6122254B2 (es) | 1974-01-30 | 1974-01-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6122254B2 (es) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5293386A (en) * | 1976-02-02 | 1977-08-05 | Toshiba Corp | Flaw detector |
| JPS56110059A (en) * | 1980-02-05 | 1981-09-01 | Toshiba Corp | Automatic inspecting device for printed wiring board |
| JPS6052728A (ja) * | 1983-08-31 | 1985-03-26 | Matsushita Electric Works Ltd | はんだ付不良検出方法 |
| JPS6095309A (ja) * | 1983-07-25 | 1985-05-28 | ロイド ドイル リミテツド | プリント配線基板を検査する方法および装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4898886A (es) * | 1972-03-29 | 1973-12-14 |
-
1974
- 1974-01-30 JP JP49011869A patent/JPS6122254B2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4898886A (es) * | 1972-03-29 | 1973-12-14 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5293386A (en) * | 1976-02-02 | 1977-08-05 | Toshiba Corp | Flaw detector |
| JPS5761184B2 (es) * | 1976-02-02 | 1982-12-23 | Tokyo Shibaura Electric Co | |
| JPS56110059A (en) * | 1980-02-05 | 1981-09-01 | Toshiba Corp | Automatic inspecting device for printed wiring board |
| JPS6095309A (ja) * | 1983-07-25 | 1985-05-28 | ロイド ドイル リミテツド | プリント配線基板を検査する方法および装置 |
| JPS6052728A (ja) * | 1983-08-31 | 1985-03-26 | Matsushita Electric Works Ltd | はんだ付不良検出方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6122254B2 (es) | 1986-05-30 |