JPS50105075A - - Google Patents
Info
- Publication number
- JPS50105075A JPS50105075A JP49009929A JP992974A JPS50105075A JP S50105075 A JPS50105075 A JP S50105075A JP 49009929 A JP49009929 A JP 49009929A JP 992974 A JP992974 A JP 992974A JP S50105075 A JPS50105075 A JP S50105075A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP992974A JPS5341077B2 (https=) | 1974-01-23 | 1974-01-23 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP992974A JPS5341077B2 (https=) | 1974-01-23 | 1974-01-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50105075A true JPS50105075A (https=) | 1975-08-19 |
| JPS5341077B2 JPS5341077B2 (https=) | 1978-10-31 |
Family
ID=11733747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP992974A Expired JPS5341077B2 (https=) | 1974-01-23 | 1974-01-23 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5341077B2 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52119360U (https=) * | 1976-03-06 | 1977-09-09 | ||
| JPS5324269U (https=) * | 1976-08-09 | 1978-03-01 | ||
| JPS5494883A (en) * | 1978-01-11 | 1979-07-26 | Nec Corp | Testing method of semiconductor device |
-
1974
- 1974-01-23 JP JP992974A patent/JPS5341077B2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52119360U (https=) * | 1976-03-06 | 1977-09-09 | ||
| JPS5324269U (https=) * | 1976-08-09 | 1978-03-01 | ||
| JPS5494883A (en) * | 1978-01-11 | 1979-07-26 | Nec Corp | Testing method of semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5341077B2 (https=) | 1978-10-31 |