JPS50104659A - - Google Patents
Info
- Publication number
- JPS50104659A JPS50104659A JP886274A JP886274A JPS50104659A JP S50104659 A JPS50104659 A JP S50104659A JP 886274 A JP886274 A JP 886274A JP 886274 A JP886274 A JP 886274A JP S50104659 A JPS50104659 A JP S50104659A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP886274A JPS50104659A (ja) | 1974-01-19 | 1974-01-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP886274A JPS50104659A (ja) | 1974-01-19 | 1974-01-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS50104659A true JPS50104659A (ja) | 1975-08-18 |
Family
ID=11704499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP886274A Pending JPS50104659A (ja) | 1974-01-19 | 1974-01-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS50104659A (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04253023A (ja) * | 1990-03-29 | 1992-09-08 | Hughes Aircraft Co | 電気・光変調器の自動バイアスコントローラ及びその制御方法。 |
| WO2016121756A1 (ja) * | 2015-01-30 | 2016-08-04 | 株式会社日立ハイテクノロジーズ | 検査装置 |
| US11346791B2 (en) | 2018-02-28 | 2022-05-31 | Hitachi High-Tech Corporation | Inspection device and inspection method thereof |
-
1974
- 1974-01-19 JP JP886274A patent/JPS50104659A/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04253023A (ja) * | 1990-03-29 | 1992-09-08 | Hughes Aircraft Co | 電気・光変調器の自動バイアスコントローラ及びその制御方法。 |
| WO2016121756A1 (ja) * | 2015-01-30 | 2016-08-04 | 株式会社日立ハイテクノロジーズ | 検査装置 |
| US10107762B2 (en) | 2015-01-30 | 2018-10-23 | Hitachi High-Technologies Corporation | Examination device |
| US10401304B2 (en) | 2015-01-30 | 2019-09-03 | Hitachi High-Technologies Corporation | Examination device |
| US11346791B2 (en) | 2018-02-28 | 2022-05-31 | Hitachi High-Tech Corporation | Inspection device and inspection method thereof |