JPS4999086A - - Google Patents
Info
- Publication number
- JPS4999086A JPS4999086A JP1025173A JP1025173A JPS4999086A JP S4999086 A JPS4999086 A JP S4999086A JP 1025173 A JP1025173 A JP 1025173A JP 1025173 A JP1025173 A JP 1025173A JP S4999086 A JPS4999086 A JP S4999086A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1025173A JPS5631540B2 (enrdf_load_stackoverflow) | 1973-01-26 | 1973-01-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1025173A JPS5631540B2 (enrdf_load_stackoverflow) | 1973-01-26 | 1973-01-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS4999086A true JPS4999086A (enrdf_load_stackoverflow) | 1974-09-19 |
JPS5631540B2 JPS5631540B2 (enrdf_load_stackoverflow) | 1981-07-22 |
Family
ID=11745080
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1025173A Expired JPS5631540B2 (enrdf_load_stackoverflow) | 1973-01-26 | 1973-01-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5631540B2 (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52138183A (en) * | 1976-05-14 | 1977-11-18 | Toshiba Corp | Inspecting apparatus for flaw |
JPS5594145A (en) * | 1979-01-12 | 1980-07-17 | Hitachi Ltd | Method of and device for inspecting surface of article |
JPS61180128A (ja) * | 1986-01-10 | 1986-08-12 | Hitachi Ltd | 物体表面検査装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4727988U (enrdf_load_stackoverflow) * | 1971-04-19 | 1972-11-29 | ||
JPS4727987U (enrdf_load_stackoverflow) * | 1971-04-19 | 1972-11-29 |
-
1973
- 1973-01-26 JP JP1025173A patent/JPS5631540B2/ja not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4727988U (enrdf_load_stackoverflow) * | 1971-04-19 | 1972-11-29 | ||
JPS4727987U (enrdf_load_stackoverflow) * | 1971-04-19 | 1972-11-29 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52138183A (en) * | 1976-05-14 | 1977-11-18 | Toshiba Corp | Inspecting apparatus for flaw |
JPS5594145A (en) * | 1979-01-12 | 1980-07-17 | Hitachi Ltd | Method of and device for inspecting surface of article |
JPS61180128A (ja) * | 1986-01-10 | 1986-08-12 | Hitachi Ltd | 物体表面検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS5631540B2 (enrdf_load_stackoverflow) | 1981-07-22 |