JPS4986084A - - Google Patents
Info
- Publication number
- JPS4986084A JPS4986084A JP48084194A JP8419473A JPS4986084A JP S4986084 A JPS4986084 A JP S4986084A JP 48084194 A JP48084194 A JP 48084194A JP 8419473 A JP8419473 A JP 8419473A JP S4986084 A JPS4986084 A JP S4986084A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Landscapes
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Textile Engineering (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Mechanical Optical Scanning Systems (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB3561072A GB1436124A (en) | 1972-07-29 | 1972-07-29 | Detection of blemishes in surfaces |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4986084A true JPS4986084A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1974-08-17 |
| JPS5433550B2 JPS5433550B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1979-10-22 |
Family
ID=10379635
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8419473A Expired JPS5433550B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1972-07-29 | 1973-07-27 |
Country Status (8)
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5218123A (en) * | 1975-08-01 | 1977-02-10 | Agency Of Ind Science & Technol | Hologram memory unit |
| JPS63183416A (ja) * | 1987-01-26 | 1988-07-28 | Canon Inc | 走査光学系 |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3932042A (en) * | 1974-05-20 | 1976-01-13 | Barry-Wehmiller Company | Container inspection apparatus and method of inspection |
| CH608628A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1975-11-21 | 1979-01-15 | Sick Optik Elektronik Erwin | |
| CA1043463A (en) * | 1975-12-05 | 1978-11-28 | Paul A. Mueller | Lumber inspection and optimization system |
| US4025198A (en) * | 1976-03-17 | 1977-05-24 | Hutchins Thomas B | Opposite-sides object inspection system |
| JPS5766345A (en) * | 1980-10-09 | 1982-04-22 | Hitachi Ltd | Inspection device for defect |
| DE3446354A1 (de) * | 1984-12-19 | 1986-06-26 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optoelektronische vergleichsvorrichtung fuer strukturen auf ebenen oberflaechen oder fuer flaechige strukturen |
| US4875780A (en) * | 1988-02-25 | 1989-10-24 | Eastman Kodak Company | Method and apparatus for inspecting reticles |
| US6252242B1 (en) * | 1992-12-03 | 2001-06-26 | Brown & Sharpe Surface Inspection Systems, Inc. | High speed optical inspection apparatus using Gaussian distribution analysis and method therefore |
| US6262432B1 (en) * | 1992-12-03 | 2001-07-17 | Brown & Sharpe Surface Inspection Systems, Inc. | High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method therefor |
| US6294793B1 (en) * | 1992-12-03 | 2001-09-25 | Brown & Sharpe Surface Inspection Systems, Inc. | High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method therefor |
| US5936725A (en) * | 1997-10-28 | 1999-08-10 | Materials Technologies Corp. | Apparatus and method for viewing and inspecting a circumferential surface area of a test object |
| US6122045A (en) * | 1997-10-28 | 2000-09-19 | Materials Technologies Corporation | Apparatus and method for viewing and inspecting a circumferential surface area of an object |
| US20030121289A1 (en) * | 2002-01-02 | 2003-07-03 | Benda John A. | Long period fiber Bragg gratings written with alternate side IR laser illumination |
| US20040207836A1 (en) * | 2002-09-27 | 2004-10-21 | Rajeshwar Chhibber | High dynamic range optical inspection system and method |
| US7451872B1 (en) | 2006-07-27 | 2008-11-18 | Boyt Harness Company, Llc | Weaponry container having a rigid outer surface |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL106466C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1954-12-16 | |||
| US3515475A (en) * | 1966-12-30 | 1970-06-02 | House Of Coins Inc | Apparatus for viewing coins or the like |
| US3646353A (en) * | 1970-10-19 | 1972-02-29 | Eastman Kodak Co | Flying spot scanner blanking |
| GB1376135A (en) * | 1971-02-26 | 1974-12-04 | Ferranti Ltd | Detection of blemishes in surfaces |
-
1972
- 1972-07-29 GB GB3561072A patent/GB1436124A/en not_active Expired
-
1973
- 1973-07-17 NO NO2918/73A patent/NO134926C/no unknown
- 1973-07-18 US US00380216A patent/US3836261A/en not_active Expired - Lifetime
- 1973-07-26 IT IT51664/73A patent/IT990024B/it active
- 1973-07-27 JP JP8419473A patent/JPS5433550B2/ja not_active Expired
- 1973-07-27 FR FR7327557A patent/FR2195346A5/fr not_active Expired
- 1973-07-27 DK DK416673AA patent/DK136281B/da unknown
- 1973-07-27 DE DE2338295A patent/DE2338295C2/de not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5218123A (en) * | 1975-08-01 | 1977-02-10 | Agency Of Ind Science & Technol | Hologram memory unit |
| JPS63183416A (ja) * | 1987-01-26 | 1988-07-28 | Canon Inc | 走査光学系 |
Also Published As
| Publication number | Publication date |
|---|---|
| DK136281C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1978-02-20 |
| DE2338295A1 (de) | 1974-02-07 |
| NO134926B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1976-09-27 |
| DK136281B (da) | 1977-09-19 |
| DE2338295C2 (de) | 1982-04-22 |
| US3836261A (en) | 1974-09-17 |
| NO134926C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1977-01-05 |
| JPS5433550B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1979-10-22 |
| IT990024B (it) | 1975-06-20 |
| GB1436124A (en) | 1976-05-19 |
| FR2195346A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1974-03-01 |