JPS4976570A - - Google Patents
Info
- Publication number
- JPS4976570A JPS4976570A JP47103589A JP10358972A JPS4976570A JP S4976570 A JPS4976570 A JP S4976570A JP 47103589 A JP47103589 A JP 47103589A JP 10358972 A JP10358972 A JP 10358972A JP S4976570 A JPS4976570 A JP S4976570A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47103589A JPS526197B2 (en:Method) | 1972-10-18 | 1972-10-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47103589A JPS526197B2 (en:Method) | 1972-10-18 | 1972-10-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4976570A true JPS4976570A (en:Method) | 1974-07-24 |
| JPS526197B2 JPS526197B2 (en:Method) | 1977-02-19 |
Family
ID=14357943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47103589A Expired JPS526197B2 (en:Method) | 1972-10-18 | 1972-10-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS526197B2 (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60211341A (ja) * | 1984-04-05 | 1985-10-23 | Nec Corp | Ｘ線二結晶回折装置 |
| JPH0387640A (ja) * | 1989-05-02 | 1991-04-12 | Yukichi Kaneko | 結晶性材料の原子配列・不整検出装置 |
| JPH1114561A (ja) * | 1997-04-30 | 1999-01-22 | Rigaku Corp | Ｘ線測定装置およびその方法 |
-
1972
- 1972-10-18 JP JP47103589A patent/JPS526197B2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60211341A (ja) * | 1984-04-05 | 1985-10-23 | Nec Corp | Ｘ線二結晶回折装置 |
| JPH0387640A (ja) * | 1989-05-02 | 1991-04-12 | Yukichi Kaneko | 結晶性材料の原子配列・不整検出装置 |
| JPH1114561A (ja) * | 1997-04-30 | 1999-01-22 | Rigaku Corp | Ｘ線測定装置およびその方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS526197B2 (en:Method) | 1977-02-19 |