JPS4974484A - - Google Patents
Info
- Publication number
- JPS4974484A JPS4974484A JP11541272A JP11541272A JPS4974484A JP S4974484 A JPS4974484 A JP S4974484A JP 11541272 A JP11541272 A JP 11541272A JP 11541272 A JP11541272 A JP 11541272A JP S4974484 A JPS4974484 A JP S4974484A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11541272A JPS5120255B2 (en) | 1972-11-17 | 1972-11-17 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11541272A JPS5120255B2 (en) | 1972-11-17 | 1972-11-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS4974484A true JPS4974484A (en) | 1974-07-18 |
JPS5120255B2 JPS5120255B2 (en) | 1976-06-23 |
Family
ID=14661915
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11541272A Expired JPS5120255B2 (en) | 1972-11-17 | 1972-11-17 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5120255B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58150839U (en) * | 1983-02-07 | 1983-10-08 | 富士通株式会社 | Measuring device using electron beam |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5983395A (en) * | 1982-11-05 | 1984-05-14 | 松下電器産業株式会社 | High frequency heater |
-
1972
- 1972-11-17 JP JP11541272A patent/JPS5120255B2/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58150839U (en) * | 1983-02-07 | 1983-10-08 | 富士通株式会社 | Measuring device using electron beam |
JPS62191Y2 (en) * | 1983-02-07 | 1987-01-07 |
Also Published As
Publication number | Publication date |
---|---|
JPS5120255B2 (en) | 1976-06-23 |