JPS4962158A - - Google Patents

Info

Publication number
JPS4962158A
JPS4962158A JP47101073A JP10107372A JPS4962158A JP S4962158 A JPS4962158 A JP S4962158A JP 47101073 A JP47101073 A JP 47101073A JP 10107372 A JP10107372 A JP 10107372A JP S4962158 A JPS4962158 A JP S4962158A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP47101073A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4962158A publication Critical patent/JPS4962158A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D30/00—Producing pneumatic or solid tyres or parts thereof
    • B29D30/06—Pneumatic tyres or parts thereof (e.g. produced by casting, moulding, compression moulding, injection moulding, centrifugal casting)
    • B29D30/38—Textile inserts, e.g. cord or canvas layers, for tyres; Treatment of inserts prior to building the tyre
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
  • Moulding By Coating Moulds (AREA)
  • Lining Or Joining Of Plastics Or The Like (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Reinforced Plastic Materials (AREA)
JP47101073A 1971-10-07 1972-10-07 Pending JPS4962158A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18741371A 1971-10-07 1971-10-07

Publications (1)

Publication Number Publication Date
JPS4962158A true JPS4962158A (ja) 1974-06-17

Family

ID=22688876

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47101073A Pending JPS4962158A (ja) 1971-10-07 1972-10-07

Country Status (4)

Country Link
US (1) US3754138A (ja)
JP (1) JPS4962158A (ja)
FR (1) FR2156088B3 (ja)
IT (1) IT968507B (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3914607A (en) * 1973-12-12 1975-10-21 Industrial Nucleonics Corp Thickness measuring apparatus and method for tire ply and similar materials
US4799247A (en) * 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
SE455441B (sv) * 1986-11-24 1988-07-11 Refina Instr Ab Sett att styra och/eller meta tjockleken av skikt sasom ytskikt pa underlag
FR2789180B1 (fr) * 1999-02-02 2001-07-06 Hutchinson Gmbh Procede de mesure de l'epaisseur d'un revetement depose sur un melange vulcanise
FR2822539B1 (fr) * 2001-03-23 2003-08-08 Bosch Gmbh Robert Capteur de position ou de deplacement simplifie, et application
US7918293B1 (en) 2005-03-09 2011-04-05 Us Synthetic Corporation Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume
DE102011051365B4 (de) * 2011-06-27 2013-08-22 Rayonic Sensor Systems Gmbh Detektionseinrichtung und System zum Messen der Dicke einer Zinkschicht auf Stahl und zum Messen des Eisengehaltes einer Zinkschicht
CN102896721A (zh) * 2011-07-26 2013-01-30 软控股份有限公司 双面胶片电子辐照装置及其辐照方法
US8969833B1 (en) 2011-12-16 2015-03-03 Us Synthetic Corporation Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume
US9632043B2 (en) * 2014-05-13 2017-04-25 Bruker Jv Israel Ltd. Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF
US9829448B2 (en) 2014-10-30 2017-11-28 Bruker Jv Israel Ltd. Measurement of small features using XRF

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2711480A (en) * 1948-06-29 1955-06-21 Friedman Herbert Method of measuring thickness of thin layers
US2897371A (en) * 1956-08-01 1959-07-28 Applied Res Lab Inc Spectroscopy
US2925497A (en) * 1956-08-09 1960-02-16 Philips Corp Fluorescence analysis
US3405267A (en) * 1964-06-17 1968-10-08 Industrial Nucleonics Corp Inner layer displacement measuring method and apparatus
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3581087A (en) * 1968-10-25 1971-05-25 Panametrics X-ray fluorescence measuring system employing balanced x-ray filters and circuit means to vary the effective relative transmission thereof
US3617744A (en) * 1969-07-01 1971-11-02 Bell Telephone Labor Inc Method and apparatus for circuit module testing by comparison of a fluorescent image with a standard pattern

Also Published As

Publication number Publication date
FR2156088B3 (ja) 1975-10-31
IT968507B (it) 1974-03-20
FR2156088A1 (ja) 1973-05-25
US3754138A (en) 1973-08-21

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