FR2156088B3 - - Google Patents

Info

Publication number
FR2156088B3
FR2156088B3 FR7235370A FR7235370A FR2156088B3 FR 2156088 B3 FR2156088 B3 FR 2156088B3 FR 7235370 A FR7235370 A FR 7235370A FR 7235370 A FR7235370 A FR 7235370A FR 2156088 B3 FR2156088 B3 FR 2156088B3
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7235370A
Other languages
French (fr)
Other versions
FR2156088A1 (ja
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Industrial Nucleonics Corp
Original Assignee
Industrial Nucleonics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Nucleonics Corp filed Critical Industrial Nucleonics Corp
Publication of FR2156088A1 publication Critical patent/FR2156088A1/fr
Application granted granted Critical
Publication of FR2156088B3 publication Critical patent/FR2156088B3/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D30/00—Producing pneumatic or solid tyres or parts thereof
    • B29D30/06—Pneumatic tyres or parts thereof (e.g. produced by casting, moulding, compression moulding, injection moulding, centrifugal casting)
    • B29D30/38—Textile inserts, e.g. cord or canvas layers, for tyres; Treatment of inserts prior to building the tyre
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Reinforced Plastic Materials (AREA)
  • Processing And Handling Of Plastics And Other Materials For Molding In General (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)
  • Moulding By Coating Moulds (AREA)
  • Lining Or Joining Of Plastics Or The Like (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
FR7235370A 1971-10-07 1972-10-05 Expired FR2156088B3 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18741371A 1971-10-07 1971-10-07

Publications (2)

Publication Number Publication Date
FR2156088A1 FR2156088A1 (ja) 1973-05-25
FR2156088B3 true FR2156088B3 (ja) 1975-10-31

Family

ID=22688876

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7235370A Expired FR2156088B3 (ja) 1971-10-07 1972-10-05

Country Status (4)

Country Link
US (1) US3754138A (ja)
JP (1) JPS4962158A (ja)
FR (1) FR2156088B3 (ja)
IT (1) IT968507B (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3914607A (en) * 1973-12-12 1975-10-21 Industrial Nucleonics Corp Thickness measuring apparatus and method for tire ply and similar materials
US4799247A (en) * 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
SE455441B (sv) * 1986-11-24 1988-07-11 Refina Instr Ab Sett att styra och/eller meta tjockleken av skikt sasom ytskikt pa underlag
FR2789180B1 (fr) * 1999-02-02 2001-07-06 Hutchinson Gmbh Procede de mesure de l'epaisseur d'un revetement depose sur un melange vulcanise
FR2822539B1 (fr) * 2001-03-23 2003-08-08 Bosch Gmbh Robert Capteur de position ou de deplacement simplifie, et application
US7918293B1 (en) 2005-03-09 2011-04-05 Us Synthetic Corporation Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume
DE102011051365B4 (de) * 2011-06-27 2013-08-22 Rayonic Sensor Systems Gmbh Detektionseinrichtung und System zum Messen der Dicke einer Zinkschicht auf Stahl und zum Messen des Eisengehaltes einer Zinkschicht
CN102896721A (zh) * 2011-07-26 2013-01-30 软控股份有限公司 双面胶片电子辐照装置及其辐照方法
US8969833B1 (en) 2011-12-16 2015-03-03 Us Synthetic Corporation Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume
US9632043B2 (en) * 2014-05-13 2017-04-25 Bruker Jv Israel Ltd. Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF
US9829448B2 (en) 2014-10-30 2017-11-28 Bruker Jv Israel Ltd. Measurement of small features using XRF

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2711480A (en) * 1948-06-29 1955-06-21 Friedman Herbert Method of measuring thickness of thin layers
US2897371A (en) * 1956-08-01 1959-07-28 Applied Res Lab Inc Spectroscopy
US2925497A (en) * 1956-08-09 1960-02-16 Philips Corp Fluorescence analysis
US3405267A (en) * 1964-06-17 1968-10-08 Industrial Nucleonics Corp Inner layer displacement measuring method and apparatus
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3581087A (en) * 1968-10-25 1971-05-25 Panametrics X-ray fluorescence measuring system employing balanced x-ray filters and circuit means to vary the effective relative transmission thereof
US3617744A (en) * 1969-07-01 1971-11-02 Bell Telephone Labor Inc Method and apparatus for circuit module testing by comparison of a fluorescent image with a standard pattern

Also Published As

Publication number Publication date
US3754138A (en) 1973-08-21
IT968507B (it) 1974-03-20
FR2156088A1 (ja) 1973-05-25
JPS4962158A (ja) 1974-06-17

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Legal Events

Date Code Title Description
ST Notification of lapse