JPS4960980A - - Google Patents
Info
- Publication number
- JPS4960980A JPS4960980A JP10342872A JP10342872A JPS4960980A JP S4960980 A JPS4960980 A JP S4960980A JP 10342872 A JP10342872 A JP 10342872A JP 10342872 A JP10342872 A JP 10342872A JP S4960980 A JPS4960980 A JP S4960980A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10342872A JPS5249756B2 (en:Method) | 1972-10-16 | 1972-10-16 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10342872A JPS5249756B2 (en:Method) | 1972-10-16 | 1972-10-16 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4960980A true JPS4960980A (en:Method) | 1974-06-13 |
| JPS5249756B2 JPS5249756B2 (en:Method) | 1977-12-19 |
Family
ID=14353752
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10342872A Expired JPS5249756B2 (en:Method) | 1972-10-16 | 1972-10-16 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5249756B2 (en:Method) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57131051A (en) * | 1981-02-06 | 1982-08-13 | Tokushu Toryo Kk | System for changing waveform of flaw detection signal in eddy-current flaw detection |
| JPS61195352A (ja) * | 1985-02-25 | 1986-08-29 | エルテイーブイ・スチール・カンパニー・インコーポレイテツド | 被加工物を検査するための方法及び装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019168253A (ja) * | 2018-03-22 | 2019-10-03 | 株式会社島津製作所 | 磁性体検査システム、磁性体検査装置および磁性体検査方法 |
-
1972
- 1972-10-16 JP JP10342872A patent/JPS5249756B2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57131051A (en) * | 1981-02-06 | 1982-08-13 | Tokushu Toryo Kk | System for changing waveform of flaw detection signal in eddy-current flaw detection |
| JPS61195352A (ja) * | 1985-02-25 | 1986-08-29 | エルテイーブイ・スチール・カンパニー・インコーポレイテツド | 被加工物を検査するための方法及び装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5249756B2 (en:Method) | 1977-12-19 |