JPS4958582A - - Google Patents
Info
- Publication number
- JPS4958582A JPS4958582A JP47093565A JP9356572A JPS4958582A JP S4958582 A JPS4958582 A JP S4958582A JP 47093565 A JP47093565 A JP 47093565A JP 9356572 A JP9356572 A JP 9356572A JP S4958582 A JPS4958582 A JP S4958582A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Eye Examination Apparatus (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47093565A JPS4958582A (hu) | 1972-09-18 | 1972-09-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47093565A JPS4958582A (hu) | 1972-09-18 | 1972-09-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4958582A true JPS4958582A (hu) | 1974-06-06 |
Family
ID=14085758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47093565A Pending JPS4958582A (hu) | 1972-09-18 | 1972-09-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4958582A (hu) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5444382A (en) * | 1977-09-09 | 1979-04-07 | Interzeag Ag | Method of displaying threshold value detected by automatic perimeter |
| JPS58121937A (ja) * | 1981-10-26 | 1983-07-20 | 有限会社宇津木光学研究所 | 視野測定方法および測定装置 |
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1972
- 1972-09-18 JP JP47093565A patent/JPS4958582A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5444382A (en) * | 1977-09-09 | 1979-04-07 | Interzeag Ag | Method of displaying threshold value detected by automatic perimeter |
| JPS6253174B2 (hu) * | 1977-09-09 | 1987-11-09 | Interzeag Ag | |
| JPS58121937A (ja) * | 1981-10-26 | 1983-07-20 | 有限会社宇津木光学研究所 | 視野測定方法および測定装置 |