JPS4957370A - - Google Patents
Info
- Publication number
- JPS4957370A JPS4957370A JP47099046A JP9904672A JPS4957370A JP S4957370 A JPS4957370 A JP S4957370A JP 47099046 A JP47099046 A JP 47099046A JP 9904672 A JP9904672 A JP 9904672A JP S4957370 A JPS4957370 A JP S4957370A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47099046A JPS4957370A (lv) | 1972-10-04 | 1972-10-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47099046A JPS4957370A (lv) | 1972-10-04 | 1972-10-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4957370A true JPS4957370A (lv) | 1974-06-04 |
Family
ID=14236565
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47099046A Pending JPS4957370A (lv) | 1972-10-04 | 1972-10-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4957370A (lv) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5597655U (lv) * | 1978-12-28 | 1980-07-07 | ||
| JPS60183879U (ja) * | 1984-05-15 | 1985-12-06 | 三菱電機株式会社 | 半導体試験装置の接触子 |
| JPH022946A (ja) * | 1988-06-17 | 1990-01-08 | Kyoei Seigyo Kiki Kk | 液晶電極基板の通電検出装置 |
| JPH022680U (lv) * | 1988-06-17 | 1990-01-09 | ||
| JP2017116266A (ja) * | 2015-12-21 | 2017-06-29 | 三菱電機株式会社 | 測定装置、測定方法 |
-
1972
- 1972-10-04 JP JP47099046A patent/JPS4957370A/ja active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5597655U (lv) * | 1978-12-28 | 1980-07-07 | ||
| JPS60183879U (ja) * | 1984-05-15 | 1985-12-06 | 三菱電機株式会社 | 半導体試験装置の接触子 |
| JPH0428067Y2 (lv) * | 1984-05-15 | 1992-07-07 | ||
| JPH022946A (ja) * | 1988-06-17 | 1990-01-08 | Kyoei Seigyo Kiki Kk | 液晶電極基板の通電検出装置 |
| JPH022680U (lv) * | 1988-06-17 | 1990-01-09 | ||
| JPH0514218Y2 (lv) * | 1988-06-17 | 1993-04-15 | ||
| JP2017116266A (ja) * | 2015-12-21 | 2017-06-29 | 三菱電機株式会社 | 測定装置、測定方法 |