JPS4937231Y1 - - Google Patents
Info
- Publication number
- JPS4937231Y1 JPS4937231Y1 JP405570U JP405570U JPS4937231Y1 JP S4937231 Y1 JPS4937231 Y1 JP S4937231Y1 JP 405570 U JP405570 U JP 405570U JP 405570 U JP405570 U JP 405570U JP S4937231 Y1 JPS4937231 Y1 JP S4937231Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Control Of Amplification And Gain Control (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP405570U JPS4937231Y1 (zh) | 1970-01-14 | 1970-01-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP405570U JPS4937231Y1 (zh) | 1970-01-14 | 1970-01-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4937231Y1 true JPS4937231Y1 (zh) | 1974-10-11 |
Family
ID=33189040
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP405570U Expired JPS4937231Y1 (zh) | 1970-01-14 | 1970-01-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4937231Y1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001035063A1 (en) * | 1998-05-12 | 2001-05-17 | Hamamatsu Photonics K.K. | Apparatus for detecting luminous energy |
JP2010197403A (ja) * | 2003-08-13 | 2010-09-09 | Luminex Corp | フロー・サイトメータ・タイプ測定システムの1つまたは複数のパラメータを制御するための方法 |
-
1970
- 1970-01-14 JP JP405570U patent/JPS4937231Y1/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001035063A1 (en) * | 1998-05-12 | 2001-05-17 | Hamamatsu Photonics K.K. | Apparatus for detecting luminous energy |
JP2010197403A (ja) * | 2003-08-13 | 2010-09-09 | Luminex Corp | フロー・サイトメータ・タイプ測定システムの1つまたは複数のパラメータを制御するための方法 |