JPS4929089B1 - - Google Patents

Info

Publication number
JPS4929089B1
JPS4929089B1 JP45040630A JP4063070A JPS4929089B1 JP S4929089 B1 JPS4929089 B1 JP S4929089B1 JP 45040630 A JP45040630 A JP 45040630A JP 4063070 A JP4063070 A JP 4063070A JP S4929089 B1 JPS4929089 B1 JP S4929089B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP45040630A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP45040630A priority Critical patent/JPS4929089B1/ja
Priority to GB1405671*[A priority patent/GB1355252A/en
Priority to US00142606A priority patent/US3736423A/en
Priority to DE19712123576 priority patent/DE2123576B2/de
Publication of JPS4929089B1 publication Critical patent/JPS4929089B1/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/153Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10Lenses
    • H01J37/14Lenses magnetic

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Particle Accelerators (AREA)
JP45040630A 1970-05-13 1970-05-13 Pending JPS4929089B1 (ru)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP45040630A JPS4929089B1 (ru) 1970-05-13 1970-05-13
GB1405671*[A GB1355252A (en) 1970-05-13 1971-05-10 Electron lenses of the magnetic field type
US00142606A US3736423A (en) 1970-05-13 1971-05-12 Electron lens of magnetic field type for an electron microscope and the like
DE19712123576 DE2123576B2 (de) 1970-05-13 1971-05-12 Magnetische elektronenlinse

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP45040630A JPS4929089B1 (ru) 1970-05-13 1970-05-13

Publications (1)

Publication Number Publication Date
JPS4929089B1 true JPS4929089B1 (ru) 1974-08-01

Family

ID=12585850

Family Applications (1)

Application Number Title Priority Date Filing Date
JP45040630A Pending JPS4929089B1 (ru) 1970-05-13 1970-05-13

Country Status (4)

Country Link
US (1) US3736423A (ru)
JP (1) JPS4929089B1 (ru)
DE (1) DE2123576B2 (ru)
GB (1) GB1355252A (ru)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3984687A (en) * 1975-03-17 1976-10-05 International Business Machines Corporation Shielded magnetic lens and deflection yoke structure for electron beam column
FR2413776A1 (fr) * 1978-01-03 1979-07-27 Thomson Csf Objectif d'optique electronique
NL7804035A (nl) * 1978-04-17 1979-10-19 Philips Nv Elektronenmikroskoop.
DE3010815C2 (de) * 1980-03-20 1982-08-19 Siemens AG, 1000 Berlin und 8000 München Hochstrom-Elektronenquelle
EP2418672B1 (en) * 2010-08-11 2013-03-20 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Multi-axis lens, beam system making use of the compound lens, and method of manufacturing the compound lens
EP2827357A1 (en) * 2013-07-18 2015-01-21 Fei Company Magnetic lens for focusing a beam of charged particles
US11621144B2 (en) * 2018-08-03 2023-04-04 Nuflare Technology, Inc. Electron optical system and multi-beam image acquiring apparatus

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3046397A (en) * 1959-06-17 1962-07-24 Tesla Np Device for compensating axial astigmatism of electron-optical systems
US3150258A (en) * 1962-07-05 1964-09-22 Philips Electronic Pharma Electromagnetic stigmators for correcting electron-optical deficiencies in the lenses of electron beam instruments

Also Published As

Publication number Publication date
GB1355252A (en) 1974-06-05
DE2123576A1 (de) 1971-12-02
DE2123576B2 (de) 1976-10-07
US3736423A (en) 1973-05-29

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