JPS4925351Y1 - - Google Patents
Info
- Publication number
- JPS4925351Y1 JPS4925351Y1 JP1546369U JP1546369U JPS4925351Y1 JP S4925351 Y1 JPS4925351 Y1 JP S4925351Y1 JP 1546369 U JP1546369 U JP 1546369U JP 1546369 U JP1546369 U JP 1546369U JP S4925351 Y1 JPS4925351 Y1 JP S4925351Y1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1546369U JPS4925351Y1 (ja) | 1969-02-22 | 1969-02-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1546369U JPS4925351Y1 (ja) | 1969-02-22 | 1969-02-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS4925351Y1 true JPS4925351Y1 (ja) | 1974-07-08 |
Family
ID=33197057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1546369U Expired JPS4925351Y1 (ja) | 1969-02-22 | 1969-02-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS4925351Y1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021503591A (ja) * | 2018-11-02 | 2021-02-12 | ハンズ レーザー テクノロジー インダストリー グループ カンパニー リミテッド | 品質検査装置、方法、システム及び一体型プローブ組立体 |
-
1969
- 1969-02-22 JP JP1546369U patent/JPS4925351Y1/ja not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021503591A (ja) * | 2018-11-02 | 2021-02-12 | ハンズ レーザー テクノロジー インダストリー グループ カンパニー リミテッド | 品質検査装置、方法、システム及び一体型プローブ組立体 |