JPS4924391A - - Google Patents
Info
- Publication number
- JPS4924391A JPS4924391A JP47064064A JP6406472A JPS4924391A JP S4924391 A JPS4924391 A JP S4924391A JP 47064064 A JP47064064 A JP 47064064A JP 6406472 A JP6406472 A JP 6406472A JP S4924391 A JPS4924391 A JP S4924391A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/22—Measuring piezoelectric properties
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47064064A JPS5138594B2 (en:Method) | 1972-06-28 | 1972-06-28 | |
| US00372165A US3832631A (en) | 1972-06-28 | 1973-06-21 | Method for measuring parameters of quartz crystal units and fixture for carrying out the same |
| US448398A US3872385A (en) | 1972-06-28 | 1974-03-05 | Fixture for measuring parameters of quartz crystal units |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47064064A JPS5138594B2 (en:Method) | 1972-06-28 | 1972-06-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4924391A true JPS4924391A (en:Method) | 1974-03-04 |
| JPS5138594B2 JPS5138594B2 (en:Method) | 1976-10-22 |
Family
ID=13247274
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47064064A Expired JPS5138594B2 (en:Method) | 1972-06-28 | 1972-06-28 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US3832631A (en:Method) |
| JP (1) | JPS5138594B2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5156395A (en) * | 1974-11-08 | 1976-05-18 | Matsushita Electric Industrial Co Ltd | Teepingumashin |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3963982A (en) * | 1974-09-17 | 1976-06-15 | General Electric Company | Apparatus for measuring the resonant frequency and coefficient of coupling of a plurality of coupled piezoelectric resonators |
| US3973181A (en) * | 1974-12-19 | 1976-08-03 | Schlumberger Technology Corporation | High frequency method and apparatus for electrical investigation of subsurface earth formations surrounding a borehole containing an electrically non-conductive fluid |
| US3992664A (en) * | 1974-12-24 | 1976-11-16 | Kokusai Denshin Denwa Kabushiki Kaisha | Method for measuring parameters of quartz crystal unit and a non-reactive constant resistance element for carrying out the same |
| US4001675A (en) * | 1975-09-22 | 1977-01-04 | R F L Industries, Inc. | Test set for measuring impedance and power dissipation of a crystal |
| DE3020110A1 (de) * | 1980-05-27 | 1982-01-14 | Siemens AG, 1000 Berlin und 8000 München | Ueberwachungseinrichtung fuer die kondensatorbatterien eines drehstrom- filterkreises |
| DE3020107A1 (de) * | 1980-05-27 | 1981-12-03 | Siemens AG, 1000 Berlin und 8000 München | Ueberwachungseinrichtung fuer einen lc-filterkreis an einem wechselspannungsnetz |
| GB2189612B (en) * | 1986-04-16 | 1989-12-06 | Stc Plc | Method of measuring the parameters of a resonator |
| US5047726A (en) * | 1990-02-16 | 1991-09-10 | Ericsson Ge Mobile Communications Inc. | Method and apparatus for implementing four-frequency measuring process for coupled-dual resonator crystals using both resonator ports |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2733405A (en) * | 1956-01-31 | gerber | ||
| US2137787A (en) * | 1936-11-13 | 1938-11-22 | Boonton Radio Corp | Method and apparatus for electrical measurements |
| US2424249A (en) * | 1944-06-23 | 1947-07-22 | John M Miller | Method of determining the resonant frequency of series resonant electrical networks |
| US2448581A (en) * | 1945-01-27 | 1948-09-07 | Bell Telephone Labor Inc | Testing circuits for piezoelectric crystals |
| US2476954A (en) * | 1945-10-23 | 1949-07-26 | Crystal Res Lab Inc | Apparatus for determining resonant frequency of piezoelectric quartz crystal blanks |
| US2542275A (en) * | 1946-09-19 | 1951-02-20 | Ekstein Hans | Method of and means for testing electrovibratory bodies |
| US2602838A (en) * | 1949-11-25 | 1952-07-08 | Phillips Petroleum Co | Electrical measuring instrument |
| US2976604A (en) * | 1956-04-13 | 1961-03-28 | Research Corp | Measurement of piezoelectric crystal characteristics |
| US3267373A (en) * | 1963-07-19 | 1966-08-16 | Colorado Instr Inc | Resonance bridge or frequency discriminator circuit and sensing system |
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1972
- 1972-06-28 JP JP47064064A patent/JPS5138594B2/ja not_active Expired
-
1973
- 1973-06-21 US US00372165A patent/US3832631A/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5156395A (en) * | 1974-11-08 | 1976-05-18 | Matsushita Electric Industrial Co Ltd | Teepingumashin |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5138594B2 (en:Method) | 1976-10-22 |
| US3832631A (en) | 1974-08-27 |