JPS5138594B2 - - Google Patents

Info

Publication number
JPS5138594B2
JPS5138594B2 JP47064064A JP6406472A JPS5138594B2 JP S5138594 B2 JPS5138594 B2 JP S5138594B2 JP 47064064 A JP47064064 A JP 47064064A JP 6406472 A JP6406472 A JP 6406472A JP S5138594 B2 JPS5138594 B2 JP S5138594B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP47064064A
Other versions
JPS4924391A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP47064064A priority Critical patent/JPS5138594B2/ja
Priority to US00372165A priority patent/US3832631A/en
Publication of JPS4924391A publication Critical patent/JPS4924391A/ja
Priority to US448398A priority patent/US3872385A/en
Publication of JPS5138594B2 publication Critical patent/JPS5138594B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/22—Measuring piezoelectric properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP47064064A 1972-06-28 1972-06-28 Expired JPS5138594B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP47064064A JPS5138594B2 (ja) 1972-06-28 1972-06-28
US00372165A US3832631A (en) 1972-06-28 1973-06-21 Method for measuring parameters of quartz crystal units and fixture for carrying out the same
US448398A US3872385A (en) 1972-06-28 1974-03-05 Fixture for measuring parameters of quartz crystal units

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP47064064A JPS5138594B2 (ja) 1972-06-28 1972-06-28

Publications (2)

Publication Number Publication Date
JPS4924391A JPS4924391A (ja) 1974-03-04
JPS5138594B2 true JPS5138594B2 (ja) 1976-10-22

Family

ID=13247274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47064064A Expired JPS5138594B2 (ja) 1972-06-28 1972-06-28

Country Status (2)

Country Link
US (1) US3832631A (ja)
JP (1) JPS5138594B2 (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3963982A (en) * 1974-09-17 1976-06-15 General Electric Company Apparatus for measuring the resonant frequency and coefficient of coupling of a plurality of coupled piezoelectric resonators
JPS5156395A (ja) * 1974-11-08 1976-05-18 Matsushita Electric Ind Co Ltd Teepingumashin
US3973181A (en) * 1974-12-19 1976-08-03 Schlumberger Technology Corporation High frequency method and apparatus for electrical investigation of subsurface earth formations surrounding a borehole containing an electrically non-conductive fluid
US3992664A (en) * 1974-12-24 1976-11-16 Kokusai Denshin Denwa Kabushiki Kaisha Method for measuring parameters of quartz crystal unit and a non-reactive constant resistance element for carrying out the same
US4001675A (en) * 1975-09-22 1977-01-04 R F L Industries, Inc. Test set for measuring impedance and power dissipation of a crystal
DE3020107A1 (de) * 1980-05-27 1981-12-03 Siemens AG, 1000 Berlin und 8000 München Ueberwachungseinrichtung fuer einen lc-filterkreis an einem wechselspannungsnetz
DE3020110A1 (de) * 1980-05-27 1982-01-14 Siemens AG, 1000 Berlin und 8000 München Ueberwachungseinrichtung fuer die kondensatorbatterien eines drehstrom- filterkreises
GB2189612B (en) * 1986-04-16 1989-12-06 Stc Plc Method of measuring the parameters of a resonator
US5047726A (en) * 1990-02-16 1991-09-10 Ericsson Ge Mobile Communications Inc. Method and apparatus for implementing four-frequency measuring process for coupled-dual resonator crystals using both resonator ports

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2733405A (en) * 1956-01-31 gerber
US2137787A (en) * 1936-11-13 1938-11-22 Boonton Radio Corp Method and apparatus for electrical measurements
US2424249A (en) * 1944-06-23 1947-07-22 John M Miller Method of determining the resonant frequency of series resonant electrical networks
US2448581A (en) * 1945-01-27 1948-09-07 Bell Telephone Labor Inc Testing circuits for piezoelectric crystals
US2476954A (en) * 1945-10-23 1949-07-26 Crystal Res Lab Inc Apparatus for determining resonant frequency of piezoelectric quartz crystal blanks
US2542275A (en) * 1946-09-19 1951-02-20 Ekstein Hans Method of and means for testing electrovibratory bodies
US2602838A (en) * 1949-11-25 1952-07-08 Phillips Petroleum Co Electrical measuring instrument
US2976604A (en) * 1956-04-13 1961-03-28 Research Corp Measurement of piezoelectric crystal characteristics
US3267373A (en) * 1963-07-19 1966-08-16 Colorado Instr Inc Resonance bridge or frequency discriminator circuit and sensing system

Also Published As

Publication number Publication date
US3832631A (en) 1974-08-27
JPS4924391A (ja) 1974-03-04

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