JPS49122759A - - Google Patents
Info
- Publication number
- JPS49122759A JPS49122759A JP2534374A JP2534374A JPS49122759A JP S49122759 A JPS49122759 A JP S49122759A JP 2534374 A JP2534374 A JP 2534374A JP 2534374 A JP2534374 A JP 2534374A JP S49122759 A JPS49122759 A JP S49122759A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19732311623 DE2311623A1 (de) | 1973-03-09 | 1973-03-09 | Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS49122759A true JPS49122759A (ja) | 1974-11-25 |
Family
ID=5874202
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2534374A Pending JPS49122759A (ja) | 1973-03-09 | 1974-03-06 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS49122759A (ja) |
| DE (1) | DE2311623A1 (ja) |
| GB (1) | GB1463363A (ja) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ATE24353T1 (de) * | 1981-08-04 | 1987-01-15 | Oesterr Forsch Seibersdorf | Verfahren zur messung der beschichtungsdicke von ummantelten draehten oder rohren. |
| AT376038B (de) * | 1982-08-04 | 1984-10-10 | Oesterr Forsch Seibersdorf | Verfahren zur messung der beschichtungsdicke von ummantelten draehten oder rohren |
| US5343146A (en) * | 1992-10-05 | 1994-08-30 | De Felsko Corporation | Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil |
| DE10252541B4 (de) * | 2002-11-08 | 2016-08-11 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Vorrichtung zur zerstörungsfreien Messung der Dicke dünner Schichten |
| US7402826B2 (en) * | 2005-05-13 | 2008-07-22 | Honeywell International Inc. | System and method for non-destructively determining thickness and uniformity of anti-tamper coatings |
| US8474157B2 (en) | 2009-08-07 | 2013-07-02 | Pierre-Andre Senizergues | Footwear lacing system |
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1973
- 1973-03-09 DE DE19732311623 patent/DE2311623A1/de not_active Ceased
-
1974
- 1974-02-21 GB GB798574A patent/GB1463363A/en not_active Expired
- 1974-03-06 JP JP2534374A patent/JPS49122759A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| GB1463363A (en) | 1977-02-02 |
| DE2311623A1 (de) | 1974-09-12 |