JPS49109062A - - Google Patents
Info
- Publication number
- JPS49109062A JPS49109062A JP48114085A JP11408573A JPS49109062A JP S49109062 A JPS49109062 A JP S49109062A JP 48114085 A JP48114085 A JP 48114085A JP 11408573 A JP11408573 A JP 11408573A JP S49109062 A JPS49109062 A JP S49109062A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48114085A JPS49109062A (OSRAM) | 1973-10-11 | 1973-10-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48114085A JPS49109062A (OSRAM) | 1973-10-11 | 1973-10-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS49109062A true JPS49109062A (OSRAM) | 1974-10-17 |
Family
ID=14628690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48114085A Pending JPS49109062A (OSRAM) | 1973-10-11 | 1973-10-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS49109062A (OSRAM) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1989005957A1 (fr) * | 1987-12-16 | 1989-06-29 | Dai Nippon Insatsu Kabushiki Kaisha | Dispositif de controle de l'epaisseur d'un recipient en resine synthetique et systeme de controle |
| JP2011247715A (ja) * | 2010-05-26 | 2011-12-08 | Ishida Co Ltd | Ｘ線検査装置 |
| DE102023125189A1 (de) | 2023-09-18 | 2025-03-20 | Krones Aktiengesellschaft | Wanddickenmessung mittels weicher Röntgenstrahlung |
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1973
- 1973-10-11 JP JP48114085A patent/JPS49109062A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1989005957A1 (fr) * | 1987-12-16 | 1989-06-29 | Dai Nippon Insatsu Kabushiki Kaisha | Dispositif de controle de l'epaisseur d'un recipient en resine synthetique et systeme de controle |
| JP2011247715A (ja) * | 2010-05-26 | 2011-12-08 | Ishida Co Ltd | Ｘ線検査装置 |
| DE102023125189A1 (de) | 2023-09-18 | 2025-03-20 | Krones Aktiengesellschaft | Wanddickenmessung mittels weicher Röntgenstrahlung |