JPS4910085A - - Google Patents
Info
- Publication number
- JPS4910085A JPS4910085A JP47051512A JP5151272A JPS4910085A JP S4910085 A JPS4910085 A JP S4910085A JP 47051512 A JP47051512 A JP 47051512A JP 5151272 A JP5151272 A JP 5151272A JP S4910085 A JPS4910085 A JP S4910085A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47051512A JPS4910085A (ru) | 1972-05-24 | 1972-05-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP47051512A JPS4910085A (ru) | 1972-05-24 | 1972-05-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4910085A true JPS4910085A (ru) | 1974-01-29 |
Family
ID=12889044
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP47051512A Pending JPS4910085A (ru) | 1972-05-24 | 1972-05-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4910085A (ru) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5582041A (en) * | 1978-11-16 | 1980-06-20 | Philips Corp | Article inspecting apparatus |
| JPS57169662A (en) * | 1981-03-25 | 1982-10-19 | Philips Nv | Inspection of matter |
| JPS59180452A (ja) * | 1983-03-31 | 1984-10-13 | Toshiba Corp | パルスｘ線診断装置 |
| JPS6042951U (ja) * | 1983-08-31 | 1985-03-26 | 株式会社島津製作所 | Ｘ線透視型腐食検査装置 |
| JPS60123754A (ja) * | 1983-12-08 | 1985-07-02 | Nippon Kokan Kk <Nkk> | 放射線透視装置 |
| WO2001077653A1 (en) * | 2000-04-06 | 2001-10-18 | Hamamatsu Photonics K.K. | X-ray inspection system |
-
1972
- 1972-05-24 JP JP47051512A patent/JPS4910085A/ja active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5582041A (en) * | 1978-11-16 | 1980-06-20 | Philips Corp | Article inspecting apparatus |
| JPS57169662A (en) * | 1981-03-25 | 1982-10-19 | Philips Nv | Inspection of matter |
| JPS59180452A (ja) * | 1983-03-31 | 1984-10-13 | Toshiba Corp | パルスｘ線診断装置 |
| JPH0479410B2 (ru) * | 1983-03-31 | 1992-12-15 | Tokyo Shibaura Electric Co | |
| JPS6042951U (ja) * | 1983-08-31 | 1985-03-26 | 株式会社島津製作所 | Ｘ線透視型腐食検査装置 |
| JPH05816Y2 (ru) * | 1983-08-31 | 1993-01-11 | ||
| JPS60123754A (ja) * | 1983-12-08 | 1985-07-02 | Nippon Kokan Kk <Nkk> | 放射線透視装置 |
| WO2001077653A1 (en) * | 2000-04-06 | 2001-10-18 | Hamamatsu Photonics K.K. | X-ray inspection system |
| US6876722B2 (en) | 2000-04-06 | 2005-04-05 | Hamamatsu Photonics K.K. | X-ray inspection system |
| US7356117B2 (en) | 2000-04-06 | 2008-04-08 | Hamamatsu Photonics K.K. | X-ray inspection system |