JPS4885188A - - Google Patents
Info
- Publication number
- JPS4885188A JPS4885188A JP1592672A JP1592672A JPS4885188A JP S4885188 A JPS4885188 A JP S4885188A JP 1592672 A JP1592672 A JP 1592672A JP 1592672 A JP1592672 A JP 1592672A JP S4885188 A JPS4885188 A JP S4885188A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1592672A JPS539111B2 (en:Method) | 1972-02-14 | 1972-02-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1592672A JPS539111B2 (en:Method) | 1972-02-14 | 1972-02-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4885188A true JPS4885188A (en:Method) | 1973-11-12 |
| JPS539111B2 JPS539111B2 (en:Method) | 1978-04-03 |
Family
ID=11902370
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1592672A Expired JPS539111B2 (en:Method) | 1972-02-14 | 1972-02-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS539111B2 (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5344077A (en) * | 1976-10-04 | 1978-04-20 | Nippon Kokan Kk | Method of compensating sensitivity of probe type eddy current flaw detector |
| JPS5441187A (en) * | 1977-09-08 | 1979-04-02 | Nippon Kokan Kk | Device for detecting surface flaw of columnar or cylindrical metal |
| JP2011252877A (ja) * | 2010-06-04 | 2011-12-15 | Jtekt Corp | 渦電流式検査装置および渦電流式検査方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01150028U (en:Method) * | 1988-03-31 | 1989-10-17 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3502968A (en) * | 1966-05-04 | 1970-03-24 | United Eng Foundry Co | Eddy current inductive flatness measurement device |
| US3611120A (en) * | 1970-02-24 | 1971-10-05 | Forster F M O | Eddy current testing systems with means to compensate for probe to workpiece spacing |
-
1972
- 1972-02-14 JP JP1592672A patent/JPS539111B2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3502968A (en) * | 1966-05-04 | 1970-03-24 | United Eng Foundry Co | Eddy current inductive flatness measurement device |
| US3611120A (en) * | 1970-02-24 | 1971-10-05 | Forster F M O | Eddy current testing systems with means to compensate for probe to workpiece spacing |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5344077A (en) * | 1976-10-04 | 1978-04-20 | Nippon Kokan Kk | Method of compensating sensitivity of probe type eddy current flaw detector |
| JPS5441187A (en) * | 1977-09-08 | 1979-04-02 | Nippon Kokan Kk | Device for detecting surface flaw of columnar or cylindrical metal |
| JP2011252877A (ja) * | 2010-06-04 | 2011-12-15 | Jtekt Corp | 渦電流式検査装置および渦電流式検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS539111B2 (en:Method) | 1978-04-03 |