JPS4849508A - - Google Patents
Info
- Publication number
- JPS4849508A JPS4849508A JP46083032A JP8303271A JPS4849508A JP S4849508 A JPS4849508 A JP S4849508A JP 46083032 A JP46083032 A JP 46083032A JP 8303271 A JP8303271 A JP 8303271A JP S4849508 A JPS4849508 A JP S4849508A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Color Printing (AREA)
- Inks, Pencil-Leads, Or Crayons (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP46083032A JPS5017887B2 (ja) | 1971-10-20 | 1971-10-20 | |
GB4896071A GB1375395A (ja) | 1970-10-24 | 1971-10-21 | |
DE19712153043 DE2153043A1 (de) | 1970-10-24 | 1971-10-25 | Aufzeichnungsmaterial |
US420884A US3912831A (en) | 1970-10-24 | 1973-12-03 | Recording material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP46083032A JPS5017887B2 (ja) | 1971-10-20 | 1971-10-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS4849508A true JPS4849508A (ja) | 1973-07-12 |
JPS5017887B2 JPS5017887B2 (ja) | 1975-06-25 |
Family
ID=13790874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP46083032A Expired JPS5017887B2 (ja) | 1970-10-24 | 1971-10-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5017887B2 (ja) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5192206A (ja) * | 1975-02-07 | 1976-08-12 | ||
JP2017025075A (ja) * | 2011-08-12 | 2017-02-02 | 三菱瓦斯化学株式会社 | レジスト組成物、レジストパターン形成方法、それに用いるポリフェノール化合物及びそれから誘導され得るアルコール化合物 |
US20170349564A1 (en) | 2014-12-25 | 2017-12-07 | Mitsubishi Gas Chemical Company, Inc. | Compound, resin, material for forming underlayer film for lithography, underlayer film for lithography, pattern forming method, and purification method |
US10377734B2 (en) | 2013-02-08 | 2019-08-13 | Mitsubishi Gas Chemical Company, Inc. | Resist composition, method for forming resist pattern, polyphenol derivative for use in the composition |
US11137686B2 (en) | 2015-08-31 | 2021-10-05 | Mitsubishi Gas Chemical Company, Inc. | Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, and resist pattern forming method |
US11143962B2 (en) | 2015-08-31 | 2021-10-12 | Mitsubishi Gas Chemical Company, Inc. | Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, pattern forming method, resin, and purification method |
US11243467B2 (en) | 2015-09-10 | 2022-02-08 | Mitsubishi Gas Chemical Company, Inc. | Compound, resin, resist composition or radiation-sensitive composition, resist pattern formation method, method for producing amorphous film, underlayer film forming material for lithography, composition for underlayer film formation for lithography, method for forming circuit pattern, and purification method |
US11256170B2 (en) | 2015-03-31 | 2022-02-22 | Mitsubishi Gas Chemical Company, Inc. | Compound, resist composition, and method for forming resist pattern using it |
US11480877B2 (en) | 2015-03-31 | 2022-10-25 | Mitsubishi Gas Chemical Company, Inc. | Resist composition, method for forming resist pattern, and polyphenol compound used therein |
-
1971
- 1971-10-20 JP JP46083032A patent/JPS5017887B2/ja not_active Expired
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5192206A (ja) * | 1975-02-07 | 1976-08-12 | ||
JP2017025075A (ja) * | 2011-08-12 | 2017-02-02 | 三菱瓦斯化学株式会社 | レジスト組成物、レジストパターン形成方法、それに用いるポリフェノール化合物及びそれから誘導され得るアルコール化合物 |
US10377734B2 (en) | 2013-02-08 | 2019-08-13 | Mitsubishi Gas Chemical Company, Inc. | Resist composition, method for forming resist pattern, polyphenol derivative for use in the composition |
US20170349564A1 (en) | 2014-12-25 | 2017-12-07 | Mitsubishi Gas Chemical Company, Inc. | Compound, resin, material for forming underlayer film for lithography, underlayer film for lithography, pattern forming method, and purification method |
US10745372B2 (en) | 2014-12-25 | 2020-08-18 | Mitsubishi Gas Chemical Company, Inc. | Compound, resin, material for forming underlayer film for lithography, underlayer film for lithography, pattern forming method, and purification method |
US11256170B2 (en) | 2015-03-31 | 2022-02-22 | Mitsubishi Gas Chemical Company, Inc. | Compound, resist composition, and method for forming resist pattern using it |
US11480877B2 (en) | 2015-03-31 | 2022-10-25 | Mitsubishi Gas Chemical Company, Inc. | Resist composition, method for forming resist pattern, and polyphenol compound used therein |
US11137686B2 (en) | 2015-08-31 | 2021-10-05 | Mitsubishi Gas Chemical Company, Inc. | Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, and resist pattern forming method |
US11143962B2 (en) | 2015-08-31 | 2021-10-12 | Mitsubishi Gas Chemical Company, Inc. | Material for forming underlayer film for lithography, composition for forming underlayer film for lithography, underlayer film for lithography and production method thereof, pattern forming method, resin, and purification method |
US11243467B2 (en) | 2015-09-10 | 2022-02-08 | Mitsubishi Gas Chemical Company, Inc. | Compound, resin, resist composition or radiation-sensitive composition, resist pattern formation method, method for producing amorphous film, underlayer film forming material for lithography, composition for underlayer film formation for lithography, method for forming circuit pattern, and purification method |
US11572430B2 (en) | 2015-09-10 | 2023-02-07 | Mitsubishi Gas Chemical Company, Inc. | Compound, resin, resist composition or radiation-sensitive composition, resist pattern formation method, method for producing amorphous film, underlayer film forming material for lithography, composition for underlayer film formation for lithography, method for forming circuit pattern, and purification method |
Also Published As
Publication number | Publication date |
---|---|
JPS5017887B2 (ja) | 1975-06-25 |