JPS4845279A - - Google Patents

Info

Publication number
JPS4845279A
JPS4845279A JP47098902A JP9890272A JPS4845279A JP S4845279 A JPS4845279 A JP S4845279A JP 47098902 A JP47098902 A JP 47098902A JP 9890272 A JP9890272 A JP 9890272A JP S4845279 A JPS4845279 A JP S4845279A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP47098902A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4845279A publication Critical patent/JPS4845279A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02Investigating the presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP47098902A 1971-10-04 1972-10-02 Pending JPS4845279A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18621371A 1971-10-04 1971-10-04

Publications (1)

Publication Number Publication Date
JPS4845279A true JPS4845279A (enExample) 1973-06-28

Family

ID=22684087

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47098902A Pending JPS4845279A (enExample) 1971-10-04 1972-10-02

Country Status (6)

Country Link
US (1) US3715667A (enExample)
JP (1) JPS4845279A (enExample)
CA (1) CA967241A (enExample)
DE (1) DE2248684A1 (enExample)
FR (1) FR2155966A1 (enExample)
GB (1) GB1344550A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53131342U (enExample) * 1978-03-27 1978-10-18
JPH05196582A (ja) * 1991-07-31 1993-08-06 Hughes Aircraft Co マイクロ波伝送ライン反射率計を使用した材料欠陥の検出および一決定方法および装置
JP2013195219A (ja) * 2012-03-19 2013-09-30 Hakko Automation Kk 内部欠陥検査装置及び内部欠陥の検査方法

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815019A (en) * 1972-12-19 1974-06-04 Electronic Ass Of Ca Ltd Microwave low moisture measuring apparatus
US4123703A (en) * 1977-09-02 1978-10-31 Sri International Microwave method of and apparatus for flaw detection
US4626773A (en) * 1984-10-26 1986-12-02 Exxon Production Research Co. Method and means for determining rock properties using time-domain dielectric spectroscopy
US4755742A (en) * 1986-04-30 1988-07-05 Tektronix, Inc. Dual channel time domain reflectometer
US4866371A (en) * 1986-09-15 1989-09-12 Chevron Research Company Sample accommodator and method for the measurement of dielectric properties
EP0321808A1 (de) * 1987-12-23 1989-06-28 BBC Brown Boveri AG Verfahren zum Messen eines Wellenwiderstandes und einer Ausbreitungskonstante eines Zweitors
US5157338A (en) * 1991-01-22 1992-10-20 James M. Mothersbaugh Antenna VSWR indicator
US5376889A (en) * 1991-10-10 1994-12-27 Hughes Aircraft Company System and method for detecting and locating flaws on or beneath a surface
US5502392A (en) * 1992-04-30 1996-03-26 International Business Machines Corporation Methods for the measurement of the frequency dependent complex propagation matrix, impedance matrix and admittance matrix of coupled transmission lines
US5488306A (en) * 1994-05-31 1996-01-30 International Business Machines Corp. Open and short fault detector for a differential interface
US5554935A (en) * 1995-04-03 1996-09-10 The United States Of America, As Represented By The Secretary Of Agriculture Mass or weight determination of arbitrarily-shaped dielectric objects by microwave resonator measurements
US6320401B1 (en) * 1998-06-15 2001-11-20 Advantest Corporation Substrate inspection using the propagation characteristics of RF electromagnetic waves
FI991548L (fi) * 1999-07-06 2001-04-05 Neles Field Controls Oy Menetelmä rainan sakeuden mittaamiseksi ja mittalaite
US10101288B2 (en) * 2014-08-28 2018-10-16 William N. Carr Wireless impedance spectrometer
CN105424727B (zh) * 2014-09-12 2019-12-24 航天信息股份有限公司 利用微波在线检验粮食水分含量是否超标的方法和装置
US9689822B2 (en) * 2015-01-22 2017-06-27 Ut-Battelle, Llc Characterization of dielectric materials
US10551334B1 (en) * 2018-08-09 2020-02-04 William N. Carr Impedance spectrometer with metamaterial radiative filter
CN108534655B (zh) * 2018-03-22 2024-01-09 中国南方电网有限责任公司超高压输电公司曲靖局 一种架空输电线路导地线覆冰测量系统及方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53131342U (enExample) * 1978-03-27 1978-10-18
JPH05196582A (ja) * 1991-07-31 1993-08-06 Hughes Aircraft Co マイクロ波伝送ライン反射率計を使用した材料欠陥の検出および一決定方法および装置
JP2013195219A (ja) * 2012-03-19 2013-09-30 Hakko Automation Kk 内部欠陥検査装置及び内部欠陥の検査方法

Also Published As

Publication number Publication date
FR2155966A1 (enExample) 1973-05-25
GB1344550A (en) 1974-01-23
CA967241A (en) 1975-05-06
DE2248684A1 (de) 1973-04-12
US3715667A (en) 1973-02-06

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