JPS4840376A - - Google Patents

Info

Publication number
JPS4840376A
JPS4840376A JP8802472A JP8802472A JPS4840376A JP S4840376 A JPS4840376 A JP S4840376A JP 8802472 A JP8802472 A JP 8802472A JP 8802472 A JP8802472 A JP 8802472A JP S4840376 A JPS4840376 A JP S4840376A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8802472A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4840376A publication Critical patent/JPS4840376A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP8802472A 1971-09-22 1972-09-04 Pending JPS4840376A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18277971A 1971-09-22 1971-09-22

Publications (1)

Publication Number Publication Date
JPS4840376A true JPS4840376A (de) 1973-06-13

Family

ID=22669992

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8802472A Pending JPS4840376A (de) 1971-09-22 1972-09-04

Country Status (2)

Country Link
JP (1) JPS4840376A (de)
DE (1) DE2240654A1 (de)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52151801A (en) * 1976-06-14 1977-12-16 Hitachi Shipbuilding Eng Co Method of impregnating electric device with insulating varnish
EP0718880A3 (de) * 1994-12-09 1997-02-05 Texas Instruments Inc Apparat und Methode zur Ausbeuteermittlung
US6687633B2 (en) 2001-03-29 2004-02-03 Hitachi, Ltd. Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices
US6928375B2 (en) 2002-04-10 2005-08-09 Hitachi High-Technologies Corporation Inspection condition setting program, inspection device and inspection system
JP2008066711A (ja) * 2006-08-10 2008-03-21 Hitachi Ltd 半導体デバイス歩留り予測システムおよび方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52151801A (en) * 1976-06-14 1977-12-16 Hitachi Shipbuilding Eng Co Method of impregnating electric device with insulating varnish
EP0718880A3 (de) * 1994-12-09 1997-02-05 Texas Instruments Inc Apparat und Methode zur Ausbeuteermittlung
US6687633B2 (en) 2001-03-29 2004-02-03 Hitachi, Ltd. Inspection system, inspection apparatus, inspection program, and production method of semiconductor devices
US6928375B2 (en) 2002-04-10 2005-08-09 Hitachi High-Technologies Corporation Inspection condition setting program, inspection device and inspection system
JP2008066711A (ja) * 2006-08-10 2008-03-21 Hitachi Ltd 半導体デバイス歩留り予測システムおよび方法

Also Published As

Publication number Publication date
DE2240654A1 (de) 1973-03-29

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