JPS4831053A - - Google Patents

Info

Publication number
JPS4831053A
JPS4831053A JP47085018A JP8501872A JPS4831053A JP S4831053 A JPS4831053 A JP S4831053A JP 47085018 A JP47085018 A JP 47085018A JP 8501872 A JP8501872 A JP 8501872A JP S4831053 A JPS4831053 A JP S4831053A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP47085018A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4831053A publication Critical patent/JPS4831053A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/40—Resistors
    • H10D1/43—Resistors having PN junctions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D10/00—Bipolar junction transistors [BJT]
    • H10D10/40—Vertical BJTs
    • H10D10/421—Vertical BJTs having both emitter-base and base-collector junctions ending at the same surface of the body
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102—Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/105—Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] 
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/124—Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/177—Base regions of bipolar transistors, e.g. BJTs or IGBTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/01—Manufacture or treatment
    • H10W10/031—Manufacture or treatment of isolation regions comprising PN junctions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/30—Isolation regions comprising PN junctions

Landscapes

  • Bipolar Transistors (AREA)
JP47085018A 1971-08-26 1972-08-26 Pending JPS4831053A (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17512471A 1971-08-26 1971-08-26

Publications (1)

Publication Number Publication Date
JPS4831053A true JPS4831053A (enExample) 1973-04-24

Family

ID=22639009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP47085018A Pending JPS4831053A (enExample) 1971-08-26 1972-08-26

Country Status (5)

Country Link
US (1) US4074293A (enExample)
JP (1) JPS4831053A (enExample)
DE (1) DE2241600A1 (enExample)
FR (1) FR2150542B1 (enExample)
IT (1) IT964287B (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4113512A (en) * 1976-10-28 1978-09-12 International Business Machines Corporation Technique for preventing forward biased epi-isolation degradation
WO1980001337A1 (en) * 1978-12-20 1980-06-26 Western Electric Co High voltage dielectrically isolated solid-state switch
US4602268A (en) * 1978-12-20 1986-07-22 At&T Bell Laboratories High voltage dielectrically isolated dual gate solid-state switch
US4608590A (en) * 1978-12-20 1986-08-26 At&T Bell Laboratories High voltage dielectrically isolated solid-state switch
CA1131800A (en) * 1978-12-20 1982-09-14 Bernard T. Murphy High voltage junction solid-state switch
CA1145057A (en) * 1979-12-28 1983-04-19 Adrian R. Hartman High voltage solid-state switch
DE3141203A1 (de) * 1981-10-16 1983-04-28 Siemens AG, 1000 Berlin und 8000 München Planares halbleiterbauelement
DE3215652A1 (de) * 1982-04-27 1983-10-27 Siemens AG, 1000 Berlin und 8000 München Integrierbarer bipolarer transistor
DE3219888A1 (de) * 1982-05-27 1983-12-01 Deutsche Itt Industries Gmbh, 7800 Freiburg Planares halbleiterbauelement und verfahren zur herstellung
US4704678A (en) * 1982-11-26 1987-11-03 Inmos Limited Function set for a microcomputer
US6414368B1 (en) 1982-11-26 2002-07-02 Stmicroelectronics Limited Microcomputer with high density RAM on single chip
US5243698A (en) * 1982-11-26 1993-09-07 Inmos Limited Microcomputer
IT1213027B (it) * 1986-01-24 1989-12-07 Sgs Microelettrica Spa Densita'.!circuito integrato a semiconduttore, in particolare del tipo comprendente dispositivi ad alta tensione e dispositivi di elaborazione di segnale ad alta
IT1217214B (it) * 1988-04-27 1990-03-14 Sgs Thomson Microelectronics Circuito integrato per alta tensione con isolamento a giunzione
GB8817459D0 (en) * 1988-07-22 1988-08-24 Gen Electric Semiconductor devices
EP0360036B1 (de) * 1988-09-20 1994-06-01 Siemens Aktiengesellschaft Planarer pn-Übergang hoher Spannungsfestigkeit
US5479046A (en) * 1990-06-28 1995-12-26 Robert Bosch Gmbh Monolithically integrated semiconductor arrangement with a cover electrode
DE4020519A1 (de) * 1990-06-28 1992-01-02 Bosch Gmbh Robert Monolithisch integrierte halbleiteranordnung
EP0632502B1 (en) * 1993-06-28 1999-03-17 Consorzio per la Ricerca sulla Microelettronica nel Mezzogiorno Bipolar power transistor with high collector breakdown voltage and related manufacturing process
US5930660A (en) * 1997-10-17 1999-07-27 General Semiconductor, Inc. Method for fabricating diode with improved reverse energy characteristics
US20060255401A1 (en) * 2005-05-11 2006-11-16 Yang Robert K Increasing breakdown voltage in semiconductor devices with vertical series capacitive structures
US20070012983A1 (en) * 2005-07-15 2007-01-18 Yang Robert K Terminations for semiconductor devices with floating vertical series capacitive structures
IT1401754B1 (it) 2010-08-30 2013-08-02 St Microelectronics Srl Dispositivo elettronico integrato e relativo metodo di fabbricazione.
IT1401755B1 (it) 2010-08-30 2013-08-02 St Microelectronics Srl Dispositivo elettronico integrato a conduzione verticale e relativo metodo di fabbricazione.
IT1401756B1 (it) 2010-08-30 2013-08-02 St Microelectronics Srl Dispositivo elettronico integrato con struttura di terminazione di bordo e relativo metodo di fabbricazione.
TWI604619B (zh) 2016-09-02 2017-11-01 新唐科技股份有限公司 二極體、接面場效電晶體以及半導體元件

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL297002A (enExample) * 1962-08-23 1900-01-01
US3393349A (en) * 1964-04-30 1968-07-16 Motorola Inc Intergrated circuits having isolated islands with a plurality of semiconductor devices in each island
GB1129531A (en) * 1964-12-16 1968-10-09 Associated Semiconductor Mft Improvements in and relating to semiconductor devices
US3786318A (en) * 1966-10-14 1974-01-15 Hitachi Ltd Semiconductor device having channel preventing structure
US3772097A (en) * 1967-05-09 1973-11-13 Motorola Inc Epitaxial method for the fabrication of a distributed semiconductor power supply containing a decoupling capacitor
US3507714A (en) * 1967-08-16 1970-04-21 Westinghouse Electric Corp High current single diffused transistor
US3596149A (en) * 1967-08-16 1971-07-27 Hitachi Ltd Semiconductor integrated circuit with reduced minority carrier storage effect
US3729662A (en) * 1971-03-26 1973-04-24 Ibm Semiconductor resistor
US3787253A (en) * 1971-12-17 1974-01-22 Ibm Emitter diffusion isolated semiconductor structure

Also Published As

Publication number Publication date
IT964287B (it) 1974-01-21
FR2150542A1 (enExample) 1973-04-06
DE2241600A1 (de) 1973-03-01
US4074293A (en) 1978-02-14
FR2150542B1 (enExample) 1977-12-23

Similar Documents

Publication Publication Date Title
FR2150542B1 (enExample)
AU2691671A (enExample)
AU2485671A (enExample)
AU2684071A (enExample)
AU2742671A (enExample)
AU2952271A (enExample)
AU2941471A (enExample)
AU3005371A (enExample)
AU2726271A (enExample)
AU2564071A (enExample)
AU3555471A (enExample)
AU2669471A (enExample)
AU2577671A (enExample)
AU2588771A (enExample)
AU2486471A (enExample)
AU2837671A (enExample)
AU2415871A (enExample)
AU2399971A (enExample)
AU2930871A (enExample)
AU2755871A (enExample)
AU2880771A (enExample)
AU2473671A (enExample)
AU3025871A (enExample)
AU2503871A (enExample)
AU2836771A (enExample)