JPS4828176A - - Google Patents

Info

Publication number
JPS4828176A
JPS4828176A JP6221371A JP6221371A JPS4828176A JP S4828176 A JPS4828176 A JP S4828176A JP 6221371 A JP6221371 A JP 6221371A JP 6221371 A JP6221371 A JP 6221371A JP S4828176 A JPS4828176 A JP S4828176A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6221371A
Other languages
Japanese (ja)
Other versions
JPS5137867B2 (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6221371A priority Critical patent/JPS5137867B2/ja
Publication of JPS4828176A publication Critical patent/JPS4828176A/ja
Publication of JPS5137867B2 publication Critical patent/JPS5137867B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP6221371A 1971-08-16 1971-08-16 Expired JPS5137867B2 (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6221371A JPS5137867B2 (en:Method) 1971-08-16 1971-08-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6221371A JPS5137867B2 (en:Method) 1971-08-16 1971-08-16

Publications (2)

Publication Number Publication Date
JPS4828176A true JPS4828176A (en:Method) 1973-04-13
JPS5137867B2 JPS5137867B2 (en:Method) 1976-10-18

Family

ID=44515083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6221371A Expired JPS5137867B2 (en:Method) 1971-08-16 1971-08-16

Country Status (1)

Country Link
JP (1) JPS5137867B2 (en:Method)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075747U (en:Method) * 1973-11-14 1975-07-02
JPS50110286A (en:Method) * 1974-02-06 1975-08-30
JPS5231552A (en) * 1975-09-04 1977-03-10 Matsushita Electric Ind Co Ltd Hot water heating and cooling device
JPS5320869U (en:Method) * 1976-07-30 1978-02-22
JPS53103667U (en:Method) * 1977-01-26 1978-08-21
JPS5421177A (en) * 1977-07-18 1979-02-17 Mitsubishi Electric Corp Measuring unit for characters
JPS5513588A (en) * 1978-07-17 1980-01-30 Nec Corp Sampling circuit
JPS5521056A (en) * 1978-08-01 1980-02-14 Chiyou Lsi Gijutsu Kenkyu Kumiai Laser scanning microscopic apparatus
JPS5558468A (en) * 1978-10-26 1980-05-01 Ishikawajima Harima Heavy Ind Co Ltd Electrical deterioration degree and deterioration location detection method of electric circuit
JPS5868679A (ja) * 1981-10-19 1983-04-23 Mitsubishi Electric Corp 半導体素子の特性測定方法
JPS61252461A (ja) * 1985-05-02 1986-11-10 ホシザキ電機株式会社 給湯器付き冷凍機

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6113946U (ja) * 1984-06-29 1986-01-27 株式会社安川電機 半導体素子の冷却装置

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075747U (en:Method) * 1973-11-14 1975-07-02
JPS50110286A (en:Method) * 1974-02-06 1975-08-30
JPS5231552A (en) * 1975-09-04 1977-03-10 Matsushita Electric Ind Co Ltd Hot water heating and cooling device
JPS5320869U (en:Method) * 1976-07-30 1978-02-22
JPS53103667U (en:Method) * 1977-01-26 1978-08-21
JPS5421177A (en) * 1977-07-18 1979-02-17 Mitsubishi Electric Corp Measuring unit for characters
JPS5513588A (en) * 1978-07-17 1980-01-30 Nec Corp Sampling circuit
JPS5521056A (en) * 1978-08-01 1980-02-14 Chiyou Lsi Gijutsu Kenkyu Kumiai Laser scanning microscopic apparatus
JPS5558468A (en) * 1978-10-26 1980-05-01 Ishikawajima Harima Heavy Ind Co Ltd Electrical deterioration degree and deterioration location detection method of electric circuit
JPS5868679A (ja) * 1981-10-19 1983-04-23 Mitsubishi Electric Corp 半導体素子の特性測定方法
JPS61252461A (ja) * 1985-05-02 1986-11-10 ホシザキ電機株式会社 給湯器付き冷凍機

Also Published As

Publication number Publication date
JPS5137867B2 (en:Method) 1976-10-18

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