JPS48104261U - - Google Patents

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Publication number
JPS48104261U
JPS48104261U JP2878872U JP2878872U JPS48104261U JP S48104261 U JPS48104261 U JP S48104261U JP 2878872 U JP2878872 U JP 2878872U JP 2878872 U JP2878872 U JP 2878872U JP S48104261 U JPS48104261 U JP S48104261U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2878872U
Other languages
Japanese (ja)
Other versions
JPS5117811Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2878872U priority Critical patent/JPS5117811Y2/ja
Publication of JPS48104261U publication Critical patent/JPS48104261U/ja
Application granted granted Critical
Publication of JPS5117811Y2 publication Critical patent/JPS5117811Y2/ja
Expired legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2878872U 1972-03-09 1972-03-09 Expired JPS5117811Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2878872U JPS5117811Y2 (enrdf_load_stackoverflow) 1972-03-09 1972-03-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2878872U JPS5117811Y2 (enrdf_load_stackoverflow) 1972-03-09 1972-03-09

Publications (2)

Publication Number Publication Date
JPS48104261U true JPS48104261U (enrdf_load_stackoverflow) 1973-12-05
JPS5117811Y2 JPS5117811Y2 (enrdf_load_stackoverflow) 1976-05-13

Family

ID=27889632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2878872U Expired JPS5117811Y2 (enrdf_load_stackoverflow) 1972-03-09 1972-03-09

Country Status (1)

Country Link
JP (1) JPS5117811Y2 (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185834U (ja) * 1975-02-10 1984-12-10 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 試験システム用接続装置
JPH08111439A (ja) * 1995-10-18 1996-04-30 Tokyo Seimitsu Co Ltd 半導体素子検査方法
JP2005514627A (ja) * 2001-12-27 2005-05-19 フォームファクター，インコーポレイテッド 能動電子部品の直接冷却をともなう冷却アセンブリ

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185834U (ja) * 1975-02-10 1984-12-10 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 試験システム用接続装置
JPH08111439A (ja) * 1995-10-18 1996-04-30 Tokyo Seimitsu Co Ltd 半導体素子検査方法
JP2005514627A (ja) * 2001-12-27 2005-05-19 フォームファクター，インコーポレイテッド 能動電子部品の直接冷却をともなう冷却アセンブリ

Also Published As

Publication number Publication date
JPS5117811Y2 (enrdf_load_stackoverflow) 1976-05-13

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