JPS4610635B1 - - Google Patents

Info

Publication number
JPS4610635B1
JPS4610635B1 JP5179368A JP5179368A JPS4610635B1 JP S4610635 B1 JPS4610635 B1 JP S4610635B1 JP 5179368 A JP5179368 A JP 5179368A JP 5179368 A JP5179368 A JP 5179368A JP S4610635 B1 JPS4610635 B1 JP S4610635B1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5179368A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5179368A priority Critical patent/JPS4610635B1/ja
Publication of JPS4610635B1 publication Critical patent/JPS4610635B1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
JP5179368A 1967-07-21 1968-07-22 Pending JPS4610635B1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5179368A JPS4610635B1 (ja) 1967-07-21 1968-07-22

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US65512367A 1967-07-21 1967-07-21
JP5179368A JPS4610635B1 (ja) 1967-07-21 1968-07-22

Publications (1)

Publication Number Publication Date
JPS4610635B1 true JPS4610635B1 (ja) 1971-03-18

Family

ID=24627624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5179368A Pending JPS4610635B1 (ja) 1967-07-21 1968-07-22

Country Status (5)

Country Link
US (1) US3546578A (ja)
JP (1) JPS4610635B1 (ja)
DE (1) DE1773857C3 (ja)
FR (1) FR1583095A (ja)
GB (1) GB1187333A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11020927B2 (en) 2017-06-07 2021-06-01 Aida Engineering, Ltd. Double blank detecting device for press machine and die protecting device for press machine

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030204A (en) * 1974-03-18 1977-06-21 Edwards Robert A Remote indicating solid state magnetic sensor
US4495953A (en) * 1981-12-15 1985-01-29 Bennewitz Paul F Apparatus and method for producing and using directional, electrical and magnetic fields
DE3815009A1 (de) * 1988-04-30 1989-11-09 Leybold Ag Einrichtung und verfahren zum zerstoerungsfreien messen des ohmschen widerstands duenner schichten nach dem wirbelstrom-prinzip
DE102008059032B4 (de) 2008-09-09 2013-11-07 Automation Dr. Nix Gmbh & Co. Kg Verfahren und Vorrichtung zur Bestimmung ob eine Veränderung eines Substrats unter einer das Substrat bedeckenden Schicht vorliegt
CN103165580A (zh) * 2011-12-14 2013-06-19 上海华虹Nec电子有限公司 一种金属线圈及电流检测结构
TWI467167B (zh) * 2011-12-29 2015-01-01 Ind Tech Res Inst 自激振盪電磁耦合量測裝置
US20150185255A1 (en) * 2012-09-14 2015-07-02 Colorado Seminary, Which Owns And Operates The University Of Denver Hall probe, epr coil driver and epr rapid scan deconvolution
JP6361412B2 (ja) * 2013-10-16 2018-07-25 日立金属株式会社 透磁率センサ
US10295618B2 (en) 2014-09-19 2019-05-21 Hitachi Metals, Ltd. Magnetic permeability sensor and magnetic permeability detecting method, dielectric permittivity sensor and dielectric permittivity detecting method, and magnetic permeability and dielectric permittivity sensor and magnetic permeability and dielectric permittivity detecting method
US10444187B2 (en) 2016-08-30 2019-10-15 Northwestern University System and method for electrical characterization of electrical materials
US11035912B2 (en) 2019-05-03 2021-06-15 The Board Of Trustees Of The Leland Stanford Junior University No-switching AC magnetic hall-effect measurement method
US11940505B2 (en) 2021-05-28 2024-03-26 The Board Of Trustees Of The Leland Stanford Junior University Omega and theta—a method to measure magnetic field at AC frequencies without using current spinning

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3359495A (en) * 1964-08-13 1967-12-19 Bell Inc F W Magnetic reaction testing apparatus and method of testing utilizing semiconductor means for magnetic field sensing of an eddy-current-reaction magnetic field

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11020927B2 (en) 2017-06-07 2021-06-01 Aida Engineering, Ltd. Double blank detecting device for press machine and die protecting device for press machine

Also Published As

Publication number Publication date
FR1583095A (ja) 1969-10-17
GB1187333A (en) 1970-04-08
DE1773857B2 (de) 1974-02-07
DE1773857C3 (de) 1974-09-12
US3546578A (en) 1970-12-08
DE1773857A1 (de) 1973-08-16

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